Hisatoshi Fujiwara
Engineer at Yamatake Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 18 October 2002 Paper
Proc. SPIE. 4902, Optomechatronic Systems III
KEYWORDS: Reflection, Phase shifting, Spatial resolution, Light sources, Image sensors, Moire patterns, Diffraction gratings, Camera shutters, Charge-coupled devices, Spatial frequencies

Proceedings Article | 4 October 2001 Paper
Proc. SPIE. 4564, Optomechatronic Systems II
KEYWORDS: Reflection, Glasses, LCDs, Ultraviolet radiation, Error analysis, Phase shifting, Moire patterns, Prototyping, Mirrors, Time metrology

Proceedings Article | 30 June 1998 Paper
Proc. SPIE. 3478, Laser Interferometry IX: Techniques and Analysis
KEYWORDS: Glasses, Moire patterns, Phase shifting, LCDs, Ultraviolet radiation, Semiconducting wafers, Time metrology, Phase measurement, Ceramics, Optical components

Proceedings Article | 4 November 1996 Paper
Proc. SPIE. 2862, Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
KEYWORDS: Glasses, Moire patterns, LCDs, Phase shifting, Reflection, Lenses, Ultraviolet radiation, Light sources, Silica, Semiconducting wafers

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