Hitesh A. Basantani
at Intel Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 24 June 2014 Paper
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Oxides, Vanadium, Infrared imaging, Thin films, Crystals, Germanium, Silicon, Silicon films, Plasma enhanced chemical vapor deposition, Thin film deposition

Proceedings Article | 18 June 2013 Paper
Proc. SPIE. 8704, Infrared Technology and Applications XXXIX
KEYWORDS: Oxides, Vanadium, Infrared imaging, Thin films, Sputter deposition, Ions, Oxygen, Ion beams, Molybdenum, Thin film deposition

Proceedings Article | 21 May 2011 Paper
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Microbolometers, Oxides, Vanadium, Thin films, Diffraction, Sputter deposition, Oxygen, Transmission electron microscopy, Ion beams, Nanocomposites

Proceedings Article | 21 May 2011 Paper
Proc. SPIE. 8012, Infrared Technology and Applications XXXVII
KEYWORDS: Oxides, Vanadium, Infrared imaging, Thin films, Sputter deposition, Oxygen, Transmission electron microscopy, Raman spectroscopy, Ion beams, Nanocrystals

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