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Dr. Hongmei Zhang
at Jilin Univ
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Author
Publications (1)
Proceedings Article | 12 May 2004 Paper
Correlation between the g-r noise in semiconductor lasers and device reliability
Guijun Hu, Yadong Sun, Hongmei Zhang, Jing Li, Yingxue Shi, Jiawei Shi
Proceedings Volume 5280, (2004) https://doi.org/10.1117/12.521647
KEYWORDS: Semiconductor lasers, Reliability, Electrical breakdown, Semiconductors, Power supplies, Heterojunctions, Measurement devices, Atrial fibrillation, Nondestructive evaluation, Chemical analysis
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