Hongmei Zhang
at Nanchang Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 October 2006 Paper
Hongmei Zhang, Liangming Liu, Jing Chen
Proceedings Volume 6419, 64191U (2006) https://doi.org/10.1117/12.713412
KEYWORDS: Reflectivity, Atmospheric corrections, MODIS, Aerosols, In situ metrology, Scattering, Image processing, Scanning probe microscopy, Rayleigh scattering, Remote sensing

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