Dr. Hoon Kim
at National Univ of Singapore
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 5 March 2013 Paper
Proc. SPIE. 8642, Emerging Liquid Crystal Technologies VIII
KEYWORDS: Switching, Electrodes, Polymers, Ultraviolet radiation, Molecules, Distortion, LCDs, Liquid crystals, Transmittance, Electro optics

Proceedings Article | 20 March 2010 Paper
Proc. SPIE. 7636, Extreme Ultraviolet (EUV) Lithography
KEYWORDS: Lithography, Scanners, Inspection, Electroluminescence, Photomasks, Extreme ultraviolet, Line width roughness, Extreme ultraviolet lithography, Critical dimension metrology, Semiconducting wafers

Proceedings Article | 18 March 2009 Paper
Proc. SPIE. 7271, Alternative Lithographic Technologies
KEYWORDS: Refractive index, Silicon, Reflectivity, Photomasks, Extreme ultraviolet, Extreme ultraviolet lithography, Nanoimprint lithography, Semiconducting wafers, Ruthenium, Phase shifts

Proceedings Article | 27 March 2008 Paper
Proc. SPIE. 6921, Emerging Lithographic Technologies XII
KEYWORDS: Carbon, Contamination, Silicon, Reflectivity, Photomasks, Extreme ultraviolet, Extreme ultraviolet lithography, Critical dimension metrology, Semiconducting wafers, Ruthenium

Proceedings Article | 3 October 2006 Paper
Proc. SPIE. 6353, Optical Transmission, Switching, and Subsystems IV
KEYWORDS: Transmitters, Optical filters, Eye, Optical amplifiers, Dispersion, Receivers, Modulators, Signal generators, Tolerancing, Binary data

Showing 5 of 7 publications
Conference Committee Involvement (2)
Optical Transmission, Switching, and Subsystems
2 November 2007 | Wuhan, China
Optical Transmission, Switching, and Subsystems III
7 November 2005 | Shanghai, China
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