Horlando Vargas Vargas
at Univ Politécnica de Tulancingo
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 September 2018 Paper
Proceedings Volume 10752, 107522Y (2018) https://doi.org/10.1117/12.2321714
KEYWORDS: Pattern recognition, Control systems, Inspection, Manufacturing, Visualization, Feature extraction, Error analysis, Image acquisition, Numerical integration, Testing and analysis

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