Houping Wu
at National Institute of Metrology
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 10 October 2020 Presentation + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Optical parametric oscillators, Femtosecond phenomena, Reflection, Sensors, Mode locking, Silicon, Bidirectional reflectance transmission function, Harmonic generation, Pulsed laser operation, Laser systems engineering

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11437, 2019 International Conference on Optical Instruments and Technology: Advanced Laser Technology and Applications
KEYWORDS: Optical fibers, Laser sources, Femtosecond phenomena, Ultraviolet radiation, Optical testing, Objectives, Sapphire lasers, Beam shaping, Nonlinear crystals, Pulsed laser operation

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11437, 2019 International Conference on Optical Instruments and Technology: Advanced Laser Technology and Applications
KEYWORDS: Photodetectors, Second-harmonic generation, Continuous wave operation, Femtosecond phenomena, Sensors, Crystals, Transmittance, Integrating spheres, Spectrophotometry, Pulsed laser operation

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Tunable lasers, Optical sensors, Sensors, Calibration, Lamps, Spectral calibration, Integrating spheres, Radiometry, Sensor calibration, Optical calibration

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Metrology, Calibration, Remote sensing, Optical testing, Black bodies, Radiometry, Cryogenics

Showing 5 of 14 publications
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