Mr. Hsueh-Hsing Liu Profile

Hsueh-Hsing Liu

PhD Student at National Central Univ

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Publications (4)

Proceedings Article | 4 March 2011 Paper

Growth of crack-free semi-polar (1-101) GaN on a 7°-off (001) Si substrate by metal-organic chemical vapor deposition

Hsien-Yu Lin, Hsueh-Hsing Liu, Chen-Zi Liao, Jen-Inn Chyi

Proceedings Volume 7939, 79392H (2011) https://doi.org/10.1117/12.876356

KEYWORDS: Gallium nitride, Silicon, Silica, Aluminum nitride, Chemical vapor deposition, Scanning electron microscopy, Thermal effects, Atomic force microscopy, Light emitting diodes, Metalorganic chemical vapor deposition

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Proceedings Article | 16 February 2009 Paper

Growth of high quality AlN on sapphire by using a low-temperature AlN interlayer

Hsueh-Hsing Liu, Guan-Ting Chen, Yung-Ling Lan, Geng-Yen Lee, Jen-Inn Chyi

Proceedings Volume 7216, 72160I (2009) https://doi.org/10.1117/12.809139

KEYWORDS: Aluminum nitride, Sapphire, Diodes, X-rays, Gallium nitride, Crystals, Chemical vapor deposition, Electronic components, Ultraviolet radiation, Photonic devices

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Proceedings Article | 16 February 2009 Paper

Improved surface morphology and edge definition for ohmic contacts to AlGaN/GaN heterostructures

Yung-Ling Lan, Hung-Cheng Lin, Hsueh-Hsing Liu, Geng-Yen Lee, Fan Ren, Stephen Pearton, Mao-Nan Chang, Jen-Inn Chyi

Proceedings Volume 7216, 72162P (2009) https://doi.org/10.1117/12.810165

KEYWORDS: Annealing, Surface roughness, Heterojunctions, Chromium, Molybdenum, Resistance, Aluminum, Nickel, Gallium nitride, Scanning electron microscopy

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Proceedings Article | 15 February 2008 Paper

Epitaxial lateral overgrowth of GaN on AlGaN/(111)Si micropillar array fabricated by polystyrene microsphere lithography

Guan-Ting Chen, Chia-Hua Chan, Chia-Hung Hou, Hsueh-Hsing Liu, Nai-Wei Shiu, Mao-Nan Chang, Chii-Chang Chen, Jen-Inn Chyi

Proceedings Volume 6894, 689408 (2008) https://doi.org/10.1117/12.764475

KEYWORDS: Gallium nitride, Silicon, Transmission electron microscopy, Epitaxial lateral overgrowth, Lithography, Scanning electron microscopy, Chemical vapor deposition, Atomic force microscopy, Metalorganic chemical vapor deposition, Optical properties

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