Dr. Hubertus Wabnitz Profile

Dr. Hubertus Wabnitz

at European XFEL GmbH

SPIE Involvement:

Author

Publications (10)

Proceedings Article | 21 June 2017 Presentation

Presentation

Non-thermal damage to lead tungstate induced by intense short-wavelength laser radiation (Conference Presentation)

Vojtech Vozda, Jakob Andreasson, Pavel Boháček, Tomáš Burian, Jaromir Chalupský, Thomas Dzelzainis, Mitsuru Nagasono, Robert Nagler, Art Nelson, Jerzy Pelka, Oldrich Renner, David Riley, Michael Rowen, Karel Saksl, Hubertus Wabnitz, Marta Fajardo, Roland Fäustlin, Jérôme Gaudin, Janos Hajdu, Vera Hájková, Stefan Hau-Riege, Philip Heimann, Bianca Iwan, Libor Juha, Marek Jurek, Ali Khorsand, Dorota Klinger, Maria Kozlova, Jacek Krzywinski, Richard Lee, Marc Messerschmidt, Stefan Moeller, Harald Sinn, Ryszard Sobierajski, Michele Swiggers, Kai Tiedtke, Nicusor Timneanu, Sven Toleikis, Thomas Tschentscher, Joshua Turner, Sam Vinko, Ludek Vyšín, Justin Wark, Thomas Whitcher, Makina Yabashi, William Schlotter

Proceedings Volume 10236, 102360G (2017) https://doi.org/10.1117/12.2270944

KEYWORDS: Physics, Stanford Linear Collider, Free electron lasers, Lead, Photons, States of matter, Materials processing, Electrons, Analytical research, Raman spectroscopy

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Proceedings Article | 19 May 2011 Paper

Paper

X-ray laser-induced ablation of lead compounds

J. Pelka, T. Dzelzainis, L. Juha, J. Chalupský, J. Turner, S. Moeller, R. Fäustlin, D. Klinger, A. Singer, J. Wark, J. Hajdu, J. Gaudin, K. Saksl, H. Wabnitz, B. Iwan, J. Andreasson, T. Burian, K. Tiedtke, W. Schlotter, P. Boháček, I. Vartaniants, T. Whitcher, M. Messerschmidt, S. Bajt, B. Nagler, H. Chapman, S. Toleikis, L. Vyšín, M. Matuchová, D. Riley, S. Vinko, S. Hau-Riege, P. Heimann, M. Swiggers, R. Sobierajski, J. Krzywinski, M. Rowen, V. Hájková, M. Jurek, N. Timneanu

Proceedings Volume 8077, 807718 (2011) https://doi.org/10.1117/12.890134

KEYWORDS: X-rays, Liquid crystal lasers, Laser ablation, Lead, Free electron lasers, Signal attenuation, Extreme ultraviolet, X-ray lasers, Laser damage threshold, Polymethylmethacrylate

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Proceedings Article | 18 May 2009 Paper

Paper

Damage studies of multilayer optics for XUV free electron lasers

V. Hajkova, J. Cihelka, M. Jurek, J. Pelka, A. Khorsand, F. Bijkerk, D. Klinger, E. van Hattum, J. Chalupský, H. Wabnitz, E. Louis, K. Tiedtke, U. Jastrow, L. Juha, J. Gaudin, E. Gullikson, R. Sobierajski, S. Toleikis

Proceedings Volume 7361, 73610I (2009) https://doi.org/10.1117/12.822257

KEYWORDS: Extreme ultraviolet, Multilayers, Reflectivity, Free electron lasers, Laser damage threshold, Atomic force microscopy, X-ray optics, Transmission electron microscopy, Optical coatings, Optical microscopy

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Proceedings Article | 18 May 2009 Paper

Paper

Damage thresholds of various materials irradiated by 100-ps pulses of 21.2-nm laser radiation

Ch. Hecquet, J. Polan, L. Juha, V. Hájková, M. Kozlová, J. Chalupský, J. Feldhaus, B. Rus, H. Wabnitz, T. Mocek, M. Störmer, P. Homer

Proceedings Volume 7361, 736110 (2009) https://doi.org/10.1117/12.822950

KEYWORDS: Laser damage threshold, Polymethylmethacrylate, Silicon carbide, Mirrors, Free electron lasers, Digital image correlation, Atomic force microscopy, Zinc, Laser ablation, Coating

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Proceedings Article | 18 May 2009 Paper

Paper

Interaction of intense ultrashort XUV pulses with silicon

L. Juha, S. Hau-Reige, M. Jurek, J. Chalupský, U. Jastrow, R. Sobierajski, H. Wabnitz, V. Hakova, R. London, N. Stojanovic, J. Pelka, D. Klinger, J. Krzywinski, L. Vysin, S. Toleikis, J. Cihelka

Proceedings Volume 7361, 736107 (2009) https://doi.org/10.1117/12.822152

KEYWORDS: Extreme ultraviolet, Silicon, Atomic force microscopy, Free electron lasers, Laser damage threshold, Optical microscopy, Sensors, Femtosecond phenomena, Absorption, Crystals

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Proceedings Article | 18 May 2009 Paper

Paper

Response of molecular solids to ultra-intense femtosecond soft x-ray pulses

N. Stojanovic, L. Vysin, S. Sebban, S. Toleikis, J. Gautier, M. Jurek, H. Wabnitz, J. Hajdu, J. Cihelka, V. Hájková, J. Chalupský, J. Krzywinski, Ri. London, S. Hau-Riege, T. Tschentscher, E. Papalazarou, G. Rey, K. Tiedtke, C. Valentin, P. Zeitoun, R. Sobierajski, J. Pelka, L. Juha

Proceedings Volume 7361, 736108 (2009) https://doi.org/10.1117/12.822297

KEYWORDS: Polymethylmethacrylate, Laser ablation, X-rays, Solids, Atomic force microscopy, X-ray lasers, Chemical species, Signal attenuation, Gaussian beams, Surface roughness

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Proceedings Article | 18 May 2009 Paper

Paper

Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

J. Pelka, R. Schott, J. Kuba, R. Faustlin, M. Jurek, H. Wabnitz, O. Renner, K. Sokolowski-Tinten, R. Sobierajski, P. Heimann, F. Rosmej, J. Hajdu, H. Chapman, D. Klinger, S. Bajt, A. Gleeson, B. Nagler, S. Vinko, L. Juha, T. Dzelzainis, N. Stojanovic, J. Cihelka, K. Saksl, T. Whitcher, M. Störmer, N. Timneanu, J. Chalupský, A. Khorsand, E. Galtier, R. London, S. Hau-Riege, J. Andreasson, T. Tschentscher, J. Wark, R. Lee, S. Toleikis, J. Krzywinski, D. Riley, A. Nelson, V. Hájková, L. Vyšin

Proceedings Volume 7361, 73610P (2009) https://doi.org/10.1117/12.822766

KEYWORDS: Aluminum, Plasma, Silicon, Ions, Free electron lasers, Copper, Chemical species, Spectroscopy, Mirrors, Emission spectroscopy

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Proceedings Article | 7 May 2009 Paper

Paper

Radiation damage within atomic clusters irradiated with intense VUV radiation

F. Wang, T. Möller, H. Wabnitz, E. Weckert, B. Ziaja

Proceedings Volume 7361, 73610F (2009) https://doi.org/10.1117/12.821883

KEYWORDS: Ions, Chemical species, Electrons, Vacuum ultraviolet, Ionization, Data modeling, Free electron lasers, Absorption, Xenon, Plasma

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Proceedings Article | 18 May 2007 Paper

Paper

X-ray optics power considerations for high intensity x-ray free-electron lasers based on superconducting technology

K. Tiedtke, H. Sinn, H. Wabnitz, Th. Tschentscher

Proceedings Volume 6586, 65860R (2007) https://doi.org/10.1117/12.725550

KEYWORDS: Free electron lasers, X-rays, X-ray optics, Optical components, Mirrors, Monochromators, Crystals, Superconductors, Chemical species, Signal attenuation

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Proceedings Article | 18 May 2007 Paper

Paper

Utilizing ablation of solids to characterize a focused soft x-ray laser beam

J. Feldhaus, J. Kuba, P. Homer, H. Wabnitz, J. Krzywinsky, K. Tiedtke, J. Chalupský, J. Cihelka, L. Juha, B. Rus, R. Sobierajski, V. Hájková, J. Polan, T. Mocek, M. Kozlová

Proceedings Volume 6586, 65860S (2007) https://doi.org/10.1117/12.724385

KEYWORDS: Polymethylmethacrylate, Laser ablation, X-ray lasers, Free electron lasers, Zinc, X-rays, Atomic force microscopy, Plasma, Beam shaping, Signal attenuation

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Showing 5 of 10 publications

Proceedings Volume Editor (1)

SPIE Conference Volume | 3 May 2007

Damage to VUV, EUV, and X-ray Optics

Conference Committee Involvement (1)

Damage to VUV, EUV & X-ray Optics

18 April 2007 | Prague, Czech Republic

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