Dr. Hubertus Wabnitz Profile

Dr. Hubertus Wabnitz

at European XFEL GmbH

SPIE Involvement:

Author

Publications (10)

Proceedings Article | 21 June 2017 Presentation

Presentation

Non-thermal damage to lead tungstate induced by intense short-wavelength laser radiation (Conference Presentation)

Vojtech Vozda, Pavel Boháček, Tomáš Burian, Jaromir Chalupský, Vera Hájková, Libor Juha, Ludek Vyšín, Jérôme Gaudin, Philip Heimann, Stefan Hau-Riege, Marek Jurek, Dorota Klinger, Jacek Krzywinski, Marc Messerschmidt, Stefan Moeller, Robert Nagler, Jerzy Pelka, Michael Rowen, William Schlotter, Michele Swiggers, Harald Sinn, Ryszard Sobierajski, Kai Tiedtke, Sven Toleikis, Thomas Tschentscher, Joshua Turner, Hubertus Wabnitz, Art Nelson, Maria Kozlova, Sam Vinko, Thomas Whitcher, Thomas Dzelzainis, Oldrich Renner, Karel Saksl, Roland Fäustlin, Ali Khorsand, Marta Fajardo, Bianca Iwan, Jakob Andreasson, Janos Hajdu, Nicusor Timneanu, Justin Wark, David Riley, Richard Lee, Mitsuru Nagasono, Makina Yabashi

Proceedings Volume 10236, 102360G (2017) https://doi.org/10.1117/12.2270944

KEYWORDS: Physics, Stanford Linear Collider, Free electron lasers, Lead, Photons, States of matter, Materials processing, Electrons, Analytical research, Raman spectroscopy

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Proceedings Article | 19 May 2011 Paper

Paper

X-ray laser-induced ablation of lead compounds

V. Hájková, L. Juha, P. Boháček, T. Burian, J. Chalupský, L. Vyšín, J. Gaudin, P. Heimann, S. Hau-Riege, M. Jurek, D. Klinger, J. Pelka, R. Sobierajski, J. Krzywinski, M. Messerschmidt, S. Moeller, B. Nagler, M. Rowen, W. Schlotter, M. Swiggers, J. Turner, S. Vinko, T. Whitcher, J. Wark, M. Matuchová, S. Bajt, H. Chapman, T. Dzelzainis, D. Riley, J. Andreasson, J. Hajdu, B. Iwan, N. Timneanu, K. Saksl, R. Fäustlin, A. Singer, K. Tiedtke, S. Toleikis, I. Vartaniants, H. Wabnitz

Proceedings Volume 8077, 807718 (2011) https://doi.org/10.1117/12.890134

KEYWORDS: X-rays, Liquid crystal lasers, Laser ablation, Lead, Free electron lasers, Signal attenuation, Extreme ultraviolet, X-ray lasers, Laser damage threshold, Polymethylmethacrylate

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Proceedings Article | 18 May 2009 Paper

Paper

Damage studies of multilayer optics for XUV free electron lasers

E. Louis, A. Khorsand, R. Sobierajski, E. van Hattum, M. Jurek, D. Klinger, J. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, U. Jastrow, S. Toleikis, H. Wabnitz, K. Tiedtke, J. Gaudin, E. Gullikson, F. Bijkerk

Proceedings Volume 7361, 73610I (2009) https://doi.org/10.1117/12.822257

KEYWORDS: Extreme ultraviolet, Multilayers, Reflectivity, Free electron lasers, Laser damage threshold, Atomic force microscopy, X-ray optics, Transmission electron microscopy, Optical coatings, Optical microscopy

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Proceedings Article | 18 May 2009 Paper

Paper

Damage thresholds of various materials irradiated by 100-ps pulses of 21.2-nm laser radiation

V. Hájková, J. Chalupský, H. Wabnitz, J. Feldhaus, M. Störmer, Ch. Hecquet, T. Mocek, M. Kozlová, J. Polan, P. Homer, B. Rus, L. Juha

Proceedings Volume 7361, 736110 (2009) https://doi.org/10.1117/12.822950

KEYWORDS: Laser damage threshold, Polymethylmethacrylate, Silicon carbide, Mirrors, Free electron lasers, Digital image correlation, Atomic force microscopy, Zinc, Laser ablation, Coating

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Proceedings Article | 18 May 2009 Paper

Paper

Interaction of intense ultrashort XUV pulses with silicon

R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hakova, L. Vysin, U. Jastrow, N. Stojanovic, S. Toleikis, H. Wabnitz, J. Krzywinski, S. Hau-Reige, R. London

Proceedings Volume 7361, 736107 (2009) https://doi.org/10.1117/12.822152

KEYWORDS: Extreme ultraviolet, Silicon, Atomic force microscopy, Free electron lasers, Laser damage threshold, Optical microscopy, Sensors, Femtosecond phenomena, Absorption, Crystals

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Proceedings Article | 18 May 2009 Paper

Paper

Response of molecular solids to ultra-intense femtosecond soft x-ray pulses

J. Chalupský, L. Juha, V. Hájková, J. Cihelka, L. Vysin, J. Gautier, J. Hajdu, S. Hau-Riege, M. Jurek, J. Krzywinski, Ri. London, E. Papalazarou, J. Pelka, G. Rey, S. Sebban, R. Sobierajski, N. Stojanovic, K. Tiedtke, S. Toleikis, T. Tschentscher, C. Valentin, H. Wabnitz, P. Zeitoun

Proceedings Volume 7361, 736108 (2009) https://doi.org/10.1117/12.822297

KEYWORDS: Polymethylmethacrylate, Laser ablation, X-rays, Solids, Atomic force microscopy, X-ray lasers, Chemical species, Signal attenuation, Gaussian beams, Surface roughness

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Proceedings Article | 18 May 2009 Paper

Paper

Optical emission spectroscopy of various materials irradiated by soft x-ray free-electron laser

J. Cihelka, L. Juha, J. Chalupský, F. Rosmej, O. Renner, K. Saksl, V. Hájková, L. Vyšin, E. Galtier, R. Schott, A. Khorsand, D. Riley, T. Dzelzainis, A. Nelson, R. Lee, P. Heimann, B. Nagler, S. Vinko, J. Wark, T. Whitcher, S. Toleikis, T. Tschentscher, R. Faustlin, H. Wabnitz, S. Bajt, H. Chapman, J. Krzywinski, R. Sobierajski, D. Klinger, M. Jurek, J. Pelka, S. Hau-Riege, R. London, J. Kuba, N. Stojanovic, K. Sokolowski-Tinten, A. Gleeson, M. Störmer, J. Andreasson, J. Hajdu, N. Timneanu

Proceedings Volume 7361, 73610P (2009) https://doi.org/10.1117/12.822766

KEYWORDS: Aluminum, Plasma, Silicon, Ions, Free electron lasers, Copper, Chemical species, Spectroscopy, Mirrors, Emission spectroscopy

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Proceedings Article | 7 May 2009 Paper

Paper

Radiation damage within atomic clusters irradiated with intense VUV radiation

B. Ziaja, H. Wabnitz, F. Wang, E. Weckert, T. Möller

Proceedings Volume 7361, 73610F (2009) https://doi.org/10.1117/12.821883

KEYWORDS: Ions, Chemical species, Electrons, Vacuum ultraviolet, Ionization, Data modeling, Free electron lasers, Absorption, Xenon, Plasma

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Proceedings Article | 18 May 2007 Paper

Paper

X-ray optics power considerations for high intensity x-ray free-electron lasers based on superconducting technology

Th. Tschentscher, H. Sinn, K. Tiedtke, H. Wabnitz

Proceedings Volume 6586, 65860R (2007) https://doi.org/10.1117/12.725550

KEYWORDS: Free electron lasers, X-rays, X-ray optics, Optical components, Mirrors, Monochromators, Crystals, Superconductors, Chemical species, Signal attenuation

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Proceedings Article | 18 May 2007 Paper

Paper

Utilizing ablation of solids to characterize a focused soft x-ray laser beam

J. Chalupský, L. Juha, J. Kuba, V. Hájková, J. Cihelka, P. Homer, M. Kozlová, T. Mocek, J. Polan, B. Rus, J. Krzywinsky, R. Sobierajski, H. Wabnitz, J. Feldhaus, K. Tiedtke

Proceedings Volume 6586, 65860S (2007) https://doi.org/10.1117/12.724385

KEYWORDS: Polymethylmethacrylate, Laser ablation, X-ray lasers, Free electron lasers, Zinc, X-rays, Atomic force microscopy, Plasma, Beam shaping, Signal attenuation

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Showing 5 of 10 publications

Proceedings Volume Editor (1)

SPIE Conference Volume | 3 May 2007

Damage to VUV, EUV, and X-ray Optics

Conference Committee Involvement (1)

Damage to VUV, EUV & X-ray Optics

18 April 2007 | Prague, Czech Republic

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