Dr. Huiqun Zhu Profile

Dr. Huiqun Zhu

at Univ of Shanghai for Science and Technology

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 18 December 2019 Paper

Paper

Reactive sputtering and thermal oxidation effect on transmittance of TiO2 thin films

Huiqun Zhu, Jinbo Cao, Haomin Guo, Zhenyuan Wu, Fanghong Dai

Proceedings Volume 11338, 1133814 (2019) https://doi.org/10.1117/12.2543154

KEYWORDS: Sputter deposition, Titanium dioxide, Thermal oxidation, Transmittance, Thin films, Absorption, Oxygen, Titanium, Metals, Thermal effects

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Proceedings Article | 12 December 2018 Paper

Paper

Study on preparation and sensitive properties of Ag-doped ZnO thin films

Huiqun Zhu, Chunbo Li, Lekang Li, Hui Li

Proceedings Volume 10846, 108462K (2018) https://doi.org/10.1117/12.2505519

KEYWORDS: Silver, Thin films, Zinc oxide, Annealing, Ultraviolet radiation, Sputter deposition, Zinc, Transmittance, Doping, Lithium

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Proceedings Article | 8 March 2017 Paper

Paper

Influence of Nb doping on the phase transition properties of VO2 thin films prepared by ion beam co-sputtering deposition

Huiqun Zhu, Pengfei Li, Lite Zhao, Jiahuan Liu

Proceedings Volume 10255, 1025558 (2017) https://doi.org/10.1117/12.2268724

KEYWORDS: Ion beams, Niobium, Doping, Thin films, Annealing, Resistance, Metals, Transition metals, Sputter deposition, Glasses

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Proceedings Article | 8 March 2017 Paper

Paper

Effect of ZnO buffer layer on phase transition properties of vanadium dioxide thin films

Huiqun Zhu, Lekang Li, Chunbo Li

Proceedings Volume 10255, 102554R (2017) https://doi.org/10.1117/12.2268433

KEYWORDS: Zinc oxide, Vanadium, Thin films, Sputter deposition, Composites, Resistance, Transmittance, Glasses, Crystals, Visible radiation

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Proceedings Article | 15 October 2012 Paper

Paper

Effect of Annealing on Optical Properties and Structure of the Vanadium Dioxide Thin Films

Huiqun Zhu, Yi Li, Yuming Li, Yize Huang, Guoxiang Tong, Baoying Fang, Qiuxin Zheng, Liu Li, Yujian Shen

Proceedings Volume 8418, 84181S (2012) https://doi.org/10.1117/12.978622

KEYWORDS: Annealing, Transmittance, Thin films, Infrared radiation, Vanadium, FT-IR spectroscopy, Reflectivity, Temperature metrology, Sputter deposition, Optical properties

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