Hung Yam Chan
at Texas Technological Univ
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 8 November 2005 Paper
Proc. SPIE. 6001, Wavelet Applications in Industrial Processing III
KEYWORDS: Statistical analysis, Defect detection, Image segmentation, Wavelets, X-rays, Inspection, Control systems, Feature extraction, X-ray imaging, Expectation maximization algorithms

Proceedings Article | 24 February 2005 Paper
Proc. SPIE. 5679, Machine Vision Applications in Industrial Inspection XIII
KEYWORDS: FT-IR spectroscopy, Cameras, Image processing, Wavelets, Computing systems, Feature extraction, Image classification, Fuzzy logic, Expectation maximization algorithms, Classification systems

SPIE Journal Paper | 1 December 2004
OE Vol. 43 Issue 12
KEYWORDS: Mammography, JPEG2000, Chromium, Image compression, Image segmentation, Computer programming, Discrete wavelet transforms, Image quality standards, Fractal analysis, Wavelets

Proceedings Article | 8 March 2002 Paper
Proc. SPIE. 4664, Machine Vision Applications in Industrial Inspection X
KEYWORDS: Digital image processing, Detection and tracking algorithms, Image processing, Scanners, Computing systems, Distortion, Digital imaging, Distance measurement, Image filtering, Algorithm development

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