Dr. Hussam Muhamedsalih Profile

Dr. Hussam Muhamedsalih

Senior Research Fellow at Univ of Huddersfield

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Author

Publications (5)

Proceedings Article | 27 November 2023 Paper

Single-shot dispersive interferometry for inline surface inspection

Dawei Tang, Jian Wang, Tianqi Gu, Hussam Muhamedsalih, Tong Guo, Xiangqian Jiang

Proceedings Volume 12769, 127690T (2023) https://doi.org/10.1117/12.2687322

KEYWORDS: Optical interferometry, Metrology, Interferometry, Interferograms, Spectral calibration, Fringe analysis, Interferometers, Inspection, Cameras, Calibration

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Proceedings Article | 25 April 2023 Presentation + Paper

In-process surface metrology for thin film flexible electronic devices

Liam Blunt, Hussam Muhamedsalih, Mothana Hassan, David Bird, Dan Kolb, Prashant Kumar, Dawei Tang, James Williamson

Proceedings Volume 12490, 1249007 (2023) https://doi.org/10.1117/12.2657501

KEYWORDS: Printing, Metrology, Manufacturing, Phase shifts, Optical surfaces, Interferometers, Interferograms, Flexible circuits, Thin films, Interferometry

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Proceedings Article | 18 August 2018 Presentation + Paper

Single-shot RGB polarising interferometer

H. Muhamedsalih, S. Al-Bashir, F. Gao, X. Jiang

Proceedings Volume 10749, 1074909 (2018) https://doi.org/10.1117/12.2507354

KEYWORDS: Interferometers, RGB color model, Phase shifts, Polarization, Phase shifting, Linear polarizers, Cameras, Standards development, Optical filters, Interferometry

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Proceedings Article | 5 August 2015 Paper

In-situ defect detection systems for R2R flexible PV barrier films

F. Gao, H. Muhamedsalih, D. Tang, M. Elrawemi, L. Blunt, X. Jiang, S. Edge, D. Bird, P. Hollis

Proceedings Volume 9622, 96220E (2015) https://doi.org/10.1117/12.2193140

KEYWORDS: Inspection, Photovoltaics, Defect detection, Environmental sensing, Interferometry, Interferometers, Objectives, Manufacturing, Metrology, CCD cameras

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Proceedings Article | 27 May 2011 Paper

Comparison of fast Fourier transform and convolution in wavelength scanning interferometry

H. Muhamedsalih, X. Jiang, F. Gao

Proceedings Volume 8082, 80820Q (2011) https://doi.org/10.1117/12.889357

KEYWORDS: Convolution, Interferometry, Phase shifts, Charge-coupled devices, Fourier transforms, Surface finishing, Optical interferometry, Inspection, Interferometers, Halogens

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