Dr. Hyesook Hong
Sr. Lithography Engineer
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 6 December 2004 Paper
Mark Ma, Hyesook Hong, Yong Seok Choi, Chi-Chien Ho, Mark Mason, Randy McKee
Proceedings Volume 5567, (2004) https://doi.org/10.1117/12.569309
KEYWORDS: Photomasks, Manufacturing, Optical proximity correction, Resolution enhancement technologies, Semiconducting wafers, Reticles, Silicon, Design for manufacturing, Scanning electron microscopy, Metals

Proceedings Article | 1 August 2002 Paper
Proceedings Volume 4754, (2002) https://doi.org/10.1117/12.476928
KEYWORDS: Photomasks, Critical dimension metrology, Pellicles, Semiconducting wafers, Reticles, Calibration, Etching, Photoresist processing, Process control, Metrology

Proceedings Article | 12 July 2002 Paper
Hyesook Hong, Guoqiang Xing, Andrew Mckerrow, Tae Kim, Patricia Smith
Proceedings Volume 4692, (2002) https://doi.org/10.1117/12.475693
KEYWORDS: Critical dimension metrology, Plasma, Dielectrics, Optical lithography, Photoresist materials, Nitrogen, Semiconducting wafers, Cadmium, Scanning electron microscopy, Etching

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