Dr. Hyun Mo Cho Profile

KEYWORDS: Ellipsometry, Time metrology, Spectrographs, Fourier transforms, Imaging spectroscopy, Polarization, Polarizers, Spectroscopy, Sensors, Thin films

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Proceedings Article | 15 October 2004 Paper

Azimuth calibration method in ellipsometer with imaging spectrograph

Won Chegal, Yong Jai Cho, Hyun Jong Kim, Hyun Mo Cho, Yun Woo Lee, Soo Hyun Kim

Proceedings Volume 5546, (2004) https://doi.org/10.1117/12.559382

KEYWORDS: Spectrographs, Calibration, Imaging spectroscopy, Ellipsometry, Sensors, Polarization, Signal detection, Optical testing, Spectroscopy, Thin films

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Proceedings Article | 14 October 2004 Paper

Determination of optical properties of titanium dioxide thin films on different substrates by using spectroscopic ellipsometry

Hyun Jong Kim, Yong Jai Cho, Hyun Mo Cho, Won Chegal, Yun Woo Lee, Sang Youl Kim

Proceedings Volume 5538, (2004) https://doi.org/10.1117/12.559427

KEYWORDS: Refractive index, Thin films, Silicon, Silicon films, Optical properties, Crystals, Spectroscopic ellipsometry, Dispersion, Thin film growth, Titanium dioxide

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Proceedings Article | 20 September 2002 Paper

Polychromatic modulation transfer function analysis of color LCD

Jong Sup Song, Yun Woo Lee, Hyun-Mo Cho, Seung Nam Park, In Won Lee, Jae Heung Jo

Proceedings Volume 4927, (2002) https://doi.org/10.1117/12.464314

KEYWORDS: LCDs, Modulation transfer functions, CRTs, Image quality, Image analysis, Objectives, Charge-coupled devices, Analytical research, Displays, Spatial resolution

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Proceedings Article | 8 May 2001 Paper

In-situ single-wavelength ellipsometer for a vacuum chamber

Won Chegal, Sangheon Ye, Hyun-Mo Cho, Yoonwoo Lee, Soo Hyun Kim, Yoon Keun Kwak

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.426993

KEYWORDS: Calibration, Polarizers, Thin films, Silicon, Semiconducting wafers, Thin film deposition, Silver, Analytical research, Nickel, Silicon films

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SPIE Journal Paper | 1 October 1999

Evaluation of image quality of color liquid crystal displays by measuring modulation transfer function

Tae-hee Kim, Yun Woo Lee, Hyun-Mo Cho, In Won Lee

OE, Vol. 38, Issue 10, (October 1999) https://doi.org/10.1117/12.10.1117/1.602275

KEYWORDS: Modulation transfer functions, LCDs, Image quality, Charge-coupled devices, Eye, Signal to noise ratio, Sensors, Optical filters, Control systems, Objectives

Proceedings Article | 1 November 1997 Paper

MTF measurement of LCDs by a linear CCD imager: I. Monochrome case

Tae-hee Kim, O. Choe, Yun Woo Lee, Hyun-Mo Cho, In Won Lee

Proceedings Volume 3134, (1997) https://doi.org/10.1117/12.295125

KEYWORDS: Modulation transfer functions, LCDs, Image quality, Charge-coupled devices, Imaging systems, Spatial frequencies, Bismuth, Image resolution, Quality measurement, Image processing

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Proceedings Article | 1 September 1996 Paper

New mobile scanning aerosol-ozone lidar maket-2

Hyun Mo Cho

Proceedings Volume 2778, 27781R (1996) https://doi.org/10.1117/12.2298945

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Proceedings Article | 1 September 1996 Paper

Generation of light waves with the single screw dislocation in the wavefront

Hyun Mo Cho

Proceedings Volume 2778, 27781Q (1996) https://doi.org/10.1117/12.2298944

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Proceedings Article | 1 September 1996 Paper

Equipment for real time MTF testing of copier and fax lenses

Hyun Mo Cho

Proceedings Volume 2778, 27781P (1996) https://doi.org/10.1117/12.2298943

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Proceedings Article | 16 August 1996 Paper

Determination of microstructure related optical constants of titanium dioxide thin films using optical methods

Sang-Youl Kim, Hee Kim, Hyun-Mo Cho, Yun Woo Lee

Proceedings Volume 2873, (1996) https://doi.org/10.1117/12.246228

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SPIE Journal Paper | 1 February 1996

Measurement of a long radius of curvature using a half-aperture bidirectional shearing interferometer

Yun Woo Lee, Hyun-Mo Cho, In Won Lee

OE, Vol. 35, Issue 02, (February 1996) https://doi.org/10.1117/12.10.1117/1.600919

KEYWORDS: Mirrors, Shearing interferometers, Wavefronts, Collimation, Darmstadtium, Interferometry, Fringe analysis, Optical engineering, Error analysis, Molybdenum

SPIE Journal Paper | 1 November 1993

Half-aperture shearing interferometer for collimation testing

Yun Woo Lee, Hyun-Mo Cho, In Won Lee

OE, Vol. 32, Issue 11, (November 1993) https://doi.org/10.1117/12.10.1117/12.148124

KEYWORDS: Collimation, Shearing interferometers, Wavefronts, Interferometers, Mirrors, Analytical research, Interferometry, Lithium, Fringe analysis, Visualization

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Showing 5 of 16 publications

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