Dr. HyunWoo Kim
at LG Electronics Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 October 2004 Paper
Proceedings Volume 5602, (2004) https://doi.org/10.1117/12.571193
KEYWORDS: Particles, Light scattering, Scattering, Fractal analysis, Laser scattering, Scatter measurement, Silica, Transmission electron microscopy, Calibration, Rayleigh scattering

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