Dr. Hyung-Kun Kim Profile

Dr. Hyung-Kun Kim

at SAMSUNG Electro-Mechanics

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Author

Publications (6)

Proceedings Article | 12 February 2010 Paper

Phosphor concentration and geometry for high power white light emitting diode

Kyung-Mi Moon, Se-Hwan An, Hyung-Kun Kim, Jung-Hye Chae, Yong-Jo Park

Proceedings Volume 7617, 76171Y (2010) https://doi.org/10.1117/12.851535

KEYWORDS: Light emitting diodes, Silicon, Particles, Luminous efficiency, Absorption, LED lighting, Reflectors, Reflectivity, Packaging, Refractive index

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Proceedings Article | 6 October 2006 Paper

Recent progress of high-power InGaN blue-violet laser diodes

H. Ryu, K. Ha, S. Lee, K. Choi, T. Jang, J. Son, H. Kim, J. Chae, H. Paek, Y. Sung, T. Sakong, K. Kim, O. Nam, Y. Park

Proceedings Volume 6352, 63521I (2006) https://doi.org/10.1117/12.691128

KEYWORDS: Quantum wells, Indium gallium nitride, Aluminum, Temperature metrology, Gallium nitride, Semiconductor lasers, Superlattices, Near field optics, Continuous wave operation

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Proceedings Article | 3 March 2006 Paper

Increase of output power and lifetime by improving the heat dissipation of GaN-based laser diodes

Jung-Hye Chae, Han-Youl Ryu, Kyu-Sang Kim, Kyoung-Ho Ha, Suhee Chae, Hyungkun Kim, Sung-Nam Lee, Kwang-Ki Choi, Taehoon Jang, Joong-Kon Son, Ho-Sun Baek, Youn-Joon Sung, Sakong Tan, Younhee Kim, Ok-Hyun Nam, Yong-Jo Park

Proceedings Volume 6121, 61210Y (2006) https://doi.org/10.1117/12.647332

KEYWORDS: Semiconductor lasers, Sapphire, Temperature metrology, Light sources, Indium gallium nitride, Waveguide lasers, Waveguides, Metalorganic chemical vapor deposition, Gallium nitride, Aluminum nitride

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Proceedings Article | 23 August 2000 Paper

Electrical reliability of conductive adhesive joints: curing conditions and current density dependence

Hyungkun Kim, Hong Zhou, S. Chungpaiboonpatana, Frank Shi, S. Machuga, J. Adam

Proceedings Volume 4182, (2000) https://doi.org/10.1117/12.410079

KEYWORDS: Resistance, Adhesives, Reliability, Particles, Copper, Silver, Glasses, Metals, Scanning electron microscopy, Temperature metrology

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Proceedings Article | 18 August 2000 Paper

Thickness-dependent optical and dielectric behaviors of low-k polymer thin films

Hyungkun Kim, Frank Shi, Bin Zhao, Maureen Brongo

Proceedings Volume 4181, (2000) https://doi.org/10.1117/12.395718

KEYWORDS: Dielectrics, Polymer thin films, Refractive index, Optical spectroscopy

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Proceedings Article | 11 August 1999 Paper

ILD thermal stability in deep-submicron technologies: from thin to ultrathin dielectric films

David Hsu, Hyungkun Kim, Frank Shi, Bin Zhao, Maureen Brongo, P. Schilling, Shi-Qing Wang

Proceedings Volume 3883, (1999) https://doi.org/10.1117/12.360588

KEYWORDS: Polymer thin films, Polymers, Polymethylmethacrylate, Glasses, Thin films, Picosecond phenomena, Data modeling, Refractive index, Dielectrics, Silicon

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Showing 5 of 6 publications

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