Dr. Ian C. Sandall
at The Univ of Sheffield
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 31 October 2014 Paper
Proceedings Volume 9254, 92540Q (2014) https://doi.org/10.1117/12.2069697
KEYWORDS: Indium arsenide, Bismuth, Photodiodes, Mid-IR, Diodes, Gallium arsenide, Temperature metrology, Indium, Antimony, Surface finishing

Proceedings Article | 22 March 2007 Paper
Proceedings Volume 6468, 646817 (2007) https://doi.org/10.1117/12.702733
KEYWORDS: Absorption, Semiconducting wafers, Transparency, Quantum dots, Indium gallium arsenide, Quantum dot lasers, Gallium arsenide, Temperature metrology, Doping, Laser damage threshold

Proceedings Article | 8 February 2007 Paper
Peter Blood, Helen Pask, Ian Sandall, Huw Summers
Proceedings Volume 6485, 64850J (2007) https://doi.org/10.1117/12.714264
KEYWORDS: Electrons, Quantum wells, Quantum dots, Excitons, Light emitting diodes, Absorption, Statistical modeling, Data modeling, Physics, Semiconductor lasers

Proceedings Article | 22 February 2006 Paper
Peter Smowton, Ian Sandall, Craig Walker, John Thomson, Angela Sobiesierski, Tom Badcock, David Mowbray, Hui-Yun Liu, Mark Hopkinson
Proceedings Volume 6133, 61330T (2006) https://doi.org/10.1117/12.650682
KEYWORDS: Doping, Transparency, Absorption, Quantum dots, Modulation, Quantum wells, Laser damage threshold, Gallium, Semiconductor lasers, Gallium arsenide

Proceedings Article | 1 April 2005 Paper
Proceedings Volume 5738, (2005) https://doi.org/10.1117/12.593278
KEYWORDS: Gallium arsenide, Absorption, Gallium, Quantum dots, Transmission electron microscopy, Quantum wells, Multilayers, Quantum dot lasers, Laser damage threshold, Semiconductor lasers

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