Dr. Igor V. Kozhevnikov Profile

Dr. Igor V. Kozhevnikov

at Shubnikov Institute of Crystallography

SPIE Involvement:

Author

Publications (30)

SPIE Journal Paper | 8 October 2020 Open Access

Comparative study of single-layer, bilayer, and trilayer mirrors with enhanced x-ray reflectance in 0.5- to 8-keV energy region

Yang Yang, Qiushi Huang, Igor Kozhevnikov, Yingyu Liao, Runze Qi, Andrey Sokolov, Zhuangzhuang Zhang, Zhanshan Wang

JATIS, Vol. 6, Issue 04, 044001, (October 2020) https://doi.org/10.1117/12.10.1117/1.JATIS.6.4.044001

KEYWORDS: Reflectivity, Mirrors, Platinum, Telescopes, Coating, Grazing incidence, Nickel, X-rays, Absorption, Reflection

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Proceedings Article | 21 August 2020 Presentation + Paper

Theoretical analysis and development of high efficiency tender x-ray multilayer coated gratings

Yeqi Zhuang, Qiushi Huang, Igor Kozhevnikov, Jiangtao Feng, Runze Qi, Andrey Sokolov, Fredmar Senf, Zhong Zhang, Zhanshan Wang

Proceedings Volume 11493, 114930R (2020) https://doi.org/10.1117/12.2567578

KEYWORDS: Diffraction, Diffraction gratings, X-rays, Grazing incidence, Polarizability, Optical design, Imaging spectroscopy, Energy efficiency, Neodymium

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Proceedings Article | 15 May 2017 Presentation + Paper

Growth of nano-dots on the grazing incidence mirror surface under FEL irradiation: analytic approach to modeling

I. Kozhevnikov, A. Buzmakov, F. Siewert, K. Tiedtke, M. Störmer, L. Samoylova, H. Sinn

Proceedings Volume 10236, 102360D (2017) https://doi.org/10.1117/12.2269371

KEYWORDS: Polymerization, Molecules, Probability theory, Reflection, Crystallography, Diffusion, Palladium, Photons, Synchrotrons, Analytical research

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Proceedings Article | 15 September 2016 Presentation + Paper

Development of MoSi2/Si lamellar multilayer grating for the narrowband soft x-ray monochromator

Xiangmei Wang, Qiushi Huang, Xiaowei Yang, Yang Liu, Igor Kozhevnikov, Zhong Zhang, Zhanshan Wang

Proceedings Volume 9963, 996308 (2016) https://doi.org/10.1117/12.2236620

KEYWORDS: X-rays, Mirrors, Imaging spectroscopy, Monochromators, Spectral resolution, Plasma diagnostics, Reflectivity, Silicon, Plasma, Diffraction gratings

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Proceedings Article | 23 September 2015 Paper

The normal-incidence multilayered diffraction grating for the high resolution astrophysical extreme ultraviolet spectroscopy

Xiaowei Yang, Igor Kozhevnikov, Qiushi Huang, Dechao Xu, Jiang Li, Zhong Zhang, Zhanshan Wang

Proceedings Volume 9627, 96271L (2015) https://doi.org/10.1117/12.2191307

KEYWORDS: Diffraction gratings, Diffraction, Multilayers, Reflectivity, Spectroscopy, Extreme ultraviolet, UV-Vis spectroscopy, Mirrors, Spectral resolution, Optical design

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Proceedings Article | 12 May 2015 Paper

Development of XUV multilayer gratings with high resolution and high efficiency

Xiaowei Yang, Qiushi Huang, Igor Kozhevnikov, Zhanshan Wang, Jun Zhao, Yanqing Wu

Proceedings Volume 9510, 95100Y (2015) https://doi.org/10.1117/12.2178843

KEYWORDS: Diffraction gratings, Diffraction, Extreme ultraviolet, Multilayers, Mirrors, Reflectivity, Interfaces, Silicon, Crystals, Polarizability

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SPIE Journal Paper | 9 February 2015 Open Access

Specification of x-ray mirrors in terms of system performance: new twist to an old plot

Valeriy Yashchuk, Liubov V. Samoylova, Igor Kozhevnikov

OE, Vol. 54, Issue 02, 025108, (February 2015) https://doi.org/10.1117/12.10.1117/1.OE.54.2.025108

KEYWORDS: Mirrors, X-rays, X-ray optics, Spatial frequencies, Scattering, Surface finishing, Error analysis, Autoregressive models, Metrology, Data modeling

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Proceedings Article | 17 September 2014 Paper

Specification of x-ray mirrors in terms of system performance: a new twist to an old plot

Valeriy Yashchuk, Liubov Samoylova, Igor Kozhevnikov

Proceedings Volume 9209, 92090F (2014) https://doi.org/10.1117/12.2062085

KEYWORDS: Mirrors, X-ray optics, X-rays, Spatial frequencies, Scattering, Surface finishing, Autoregressive models, Metrology, Error analysis, Data modeling

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Proceedings Article | 28 September 2011 Paper

Improved resolution for soft-x-ray monochromatization using lamellar multilayer gratings

R. van der Meer, B. Krishnan, I. Kozhevnikov, M. De Boer, B. Vratzov, H. M. Bastiaens, J. Huskens, W. van der Wiel, P. Hegeman, G. C. Brons, K.-J. Boller, F. Bijkerk

Proceedings Volume 8139, 81390Q (2011) https://doi.org/10.1117/12.892687

KEYWORDS: Reflectivity, Diffraction, Etching, Deep reactive ion etching, Reactive ion etching, Diffraction gratings, Mirrors, Photomasks, Lithography

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Proceedings Article | 24 December 2002 Paper

Wideband multilayer mirrors for medium to hard x-ray applications

Eric Ziegler, Christian Morawe, Igor Kozhevnikov, T. Bigault, Claudio Ferrero, A. Tallandier

Proceedings Volume 4782, (2002) https://doi.org/10.1117/12.455690

KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Synchrotrons, Hard x-rays, X-ray optics, Astrophysics, Crystals, Optics manufacturing

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Proceedings Article | 10 December 2001 Paper

X-ray study of surfaces and interfaces

Victor Asadchikov, Inna Bukreeva, Angela Duparre, Igor Kozhevnikov, Yury Krivonosov, Christian Morawe, Mikhail Pyatakhin, Joerg Steinert, Alexander Vinogradov, Eric Ziegler

Proceedings Volume 4449, (2001) https://doi.org/10.1117/12.450102

KEYWORDS: Reflectivity, X-rays, Scattering, Multilayers, Inverse problems, Interfaces, Spatial frequencies, Atomic force microscopy, Silicon, Mirrors

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Proceedings Article | 2 November 2000 Paper

X-ray study of the roughness of surfaces and interfaces

Igor Kozhevnikov, Victor Asadchikov, Inna Bukreeva, Angela Duparre, Yury Krivonosov, Christian Morawe, Vladimir Ostashev, Mikhail Pyatakhin, Eric Ziegler

Proceedings Volume 4099, (2000) https://doi.org/10.1117/12.405809

KEYWORDS: Scattering, X-rays, Interfaces, Laser scattering, Polishing, Atomic force microscopy, Multilayers, Spatial frequencies, Mirrors, Surface roughness

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Proceedings Article | 2 November 2000 Paper

X-ray investigations of a near surface layer of metal samples

Oleg Gilev, Victor Asadchikov, Angela Duparre, Nikolai Havronin, Igor Kozhevnikov, Yury Krivonosov, Sergey Kuznetsov, Vitaly Mikerov, Vladimir Ostashev, Vladimir Tukarev

Proceedings Volume 4099, (2000) https://doi.org/10.1117/12.405828

KEYWORDS: X-rays, Reflectivity, Scattering, Reflection, Dielectrics, Atomic force microscopy, Surface roughness, Laser scattering, Statistical modeling, Metals

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Proceedings Article | 7 September 1999 Paper

X-ray and AFM studies of ultrathin films for EUV and soft x-ray applications

Victor Asadchikov, Angela Duparre, Igor Kozhevnikov, Yury Krivonosov, Spartak Sagitov

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360105

KEYWORDS: Scattering, X-rays, Laser scattering, Interfaces, Thin films, Scatter measurement, Atomic force microscopy, Spatial frequencies, Molybdenum, Solids

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Proceedings Article | 6 September 1999 Paper

Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods

Igor Kozhevnikov, Victor Asadchikov, Angela Duparre, Oleg Gilev, Nikolai Havronin, Yury Krivonosov, Vladimir Ostashev, Joerg Steinert

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360165

KEYWORDS: Scattering, Atomic force microscopy, X-rays, Light scattering, Spatial frequencies, Silver, Hard x-rays, Scatter measurement, X-ray microscopy, Surface roughness

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Proceedings Article | 6 September 1999 Paper

X-ray study of concave surface roughness

Inna Bukreeva, Victor Asadchikov, Oleg Gilev, Nikolai Havronin, Igor Kozhevnikov, Yury Krivonosov, Vladimir Ostashev, Spartak Sagitov

Proceedings Volume 3739, (1999) https://doi.org/10.1117/12.360171

KEYWORDS: Mirrors, X-rays, Surface roughness, Scattering, Sensors, Laser scattering, Computer simulations, X-ray detectors, Laser beam diagnostics, Reflection

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Proceedings Article | 27 August 1999 Paper

Depth-graded multilayer mirrors for the hard x-ray spectral region: theory and inverse and direct problems

Eric Ziegler, Inna Bukreeva, Igor Kozhevnikov, Alexandr Pirozhkov, Eugene Ragozin

Proceedings Volume 3737, (1999) https://doi.org/10.1117/12.360033

KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Hard x-rays, Inverse problems, Absorption, Interfaces, X-ray telescopes, Dielectrics

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Proceedings Article | 11 December 1998 Paper

Theoretical study of multilayer x-ray mirrors with a wide spectral band of reflection

Igor Kozhevnikov, Inna Bukreeva, Eric Ziegler

Proceedings Volume 3448, (1998) https://doi.org/10.1117/12.332520

KEYWORDS: Reflectivity, Mirrors, Multilayers, X-rays, Inverse problems, X-ray optics, Inverse optics, Dielectrics, Hard x-rays, Interfaces

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Proceedings Article | 25 September 1995 Paper

Synthesis and measurement of Os-Si multilayer mirrors optimized for the wavelength 380 A

Igor Kozhevnikov, L. Balakireva, Anatoli Fedorenko, I. Kopealets, Vladimir Levashov, A. Stetsenko, I. Struk, Alexander Vinogradov

Proceedings Volume 2520, (1995) https://doi.org/10.1117/12.221637

KEYWORDS: Multilayers, Reflectivity, Osmium, Silicon, Mirrors, X-rays, Spherical lenses, Plasma, X-ray imaging, Argon

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