Dr. Ivan E. Kalabin
at Institute of Semiconductor Physics
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 9 June 2006 Paper
Proc. SPIE. 6258, ICONO 2005: Novel Photonics Materials: Physics and Optical Diagnostics of Nanostructures
KEYWORDS: Waveguides, Titanium, Crystals, Refractive index, X-ray diffraction, Diffusion, Annealing, Hydrogen, Solids, Information operations

Proceedings Article | 8 June 2005 Paper
Proc. SPIE. 5851, Fundamental Problems of Optoelectronics and Microelectronics II
KEYWORDS: Waveguides, Crystals, Surface finishing, 3D metrology, Annealing, Scanning electron microscopy, X-ray diffraction, Polishing, Lithium niobate, Refractive index

Proceedings Article | 3 April 2003 Paper
Proc. SPIE. 4944, Integrated Optical Devices: Fabrication and Testing
KEYWORDS: Waveguides, Refractive index, Atomic force microscopy, Crystals, Titanium, Annealing, Surface finishing, Polarization, Optical properties, Ion exchange

Proceedings Article | 3 April 2003 Paper
Proc. SPIE. 4944, Integrated Optical Devices: Fabrication and Testing
KEYWORDS: Annealing, Humidity, Crystals, Diffraction, Lithium, Temperature metrology, Lithium niobate, Transmission electron microscopy, Electron beams, Metals

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