Mr. Ivan G. Kuznetsov Profile

Ivan G. Kuznetsov

at NASA Goddard Space Flight Ctr

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 22 September 2005 Paper

Calibration of the New Horizons Long-Range Reconnaissance Imager

F. Morgan, S. Conard, H. Weaver, O. Barnouin-Jha, A. Cheng, H. Taylor, K. Cooper, R. Barkhouser, R. Boucarut, E. Darlington, M. Grey, I. Kuznetsov, T. Madison, M. Quijada, D. Sahnow, J. Stock

Proc. SPIE. 5906, Astrobiology and Planetary Missions

KEYWORDS: Calibration, Charge-coupled devices, Sensors, Bandpass filters, Collimators, Photodiodes, Temperature metrology, Telescopes, Pluto, Imaging systems

Read Abstract +

Proceedings Article | 22 January 2004 Paper

Grating efficiencies comparison study: calculations versus metrology for various types of high-groove density gratings at VUV-UV wavelengths

Ivan Kuznetsov, Erik Wilkinson, David Content, Rene Boucarut, Timothy Madison

Proc. SPIE. 5178, Optical Modeling and Performance Predictions

KEYWORDS: Coating, Atomic force microscopy, Sensors, Data modeling, Aluminum, Diffraction gratings, Scatter measurement, Holography, Mirrors, Light sources

Read Abstract +

Proceedings Article | 30 January 2002 Paper

Design, performance, and reliability of a high-angular-resolution wide-angular-range large-aperture fully-automated UV scatterometer

Ivan Kuznetsov, David Content, Rene Boucarut, Timothy Madison

Proc. SPIE. 4485, Optical Spectroscopic Techniques, Remote Sensing, and Instrumentation for Atmospheric and Space Research IV

KEYWORDS: Sensors, Mirrors, Light sources, Lamps, Scatter measurement, Vacuum ultraviolet, Bidirectional reflectance transmission function, Ultraviolet radiation, Light scattering, Monochromators

Read Abstract +

Proceedings Article | 30 January 2002 Paper

Grating groove metrology and efficiency predictions from the soft x-ray to the far infrared

David Content, Petar Arsenovic, Ivan Kuznetsov, Theo Hadjimichael

Proc. SPIE. 4485, Optical Spectroscopic Techniques, Remote Sensing, and Instrumentation for Atmospheric and Space Research IV

KEYWORDS: Polarization, Metrology, Atomic force microscopy, Lithium, Diffraction gratings, Profilometers, Calibration, Reflection, Solids, Statistical modeling

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years