Prof. Ivan K. Schuller
at Univ of California San Diego
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 26 February 2020 Presentation + Paper
Tomer Lewi, Nikita Butakov, Prasad Iyer, Hayden Evans, Hamid Chorsi, Juan Trastoy, Javier Del Valle Granda, Ilya Valmianski, Christian Urban, Yoav Kalcheim, Ivan Schuller, Jon Schuller
Proceedings Volume 11290, 112901B (2020) https://doi.org/10.1117/12.2545075
KEYWORDS: Resonators, Germanium, Modulation, Silicon, Semiconductors, Dielectrics, Doping, Magnetism

Proceedings Article | 5 September 2019 Paper
Tomer Lewi, Nikita Butakov, Prasad Iyer, Hayden Evans, David Higgs, Hamid Chorsi, Juan Trastoy, Javier Del Valle Granda, Ilya Valmianski, Christian Urban, Yoav Kalcheim, Paul Wang, Ivan Schuller, Jon Schuller
Proceedings Volume 11080, 110802P (2019) https://doi.org/10.1117/12.2528259
KEYWORDS: Modulation, Semiconductors, Resonators, Silicon, Germanium, Phase shift keying, Optical components, Infrared radiation, Thermal optics, Refractive index

Proceedings Article | 4 November 2016 Presentation
Ivan Schuller, Ali Basaran, Jose de la Venta, Juan Gabriel Ramirez, Thomas Saerbeck, Ilya Valmianski, Siming Wang
Proceedings Volume 9931, 99312B (2016) https://doi.org/10.1117/12.2239919
KEYWORDS: Ferromagnetics, Magnetism, Oxides, Transition metals, Thin film devices, Thin films, Logic devices, Nickel, Iron, Anisotropy

Proceedings Article | 6 September 2000 Paper
Alain Gilabert, R. Cauro, Jean-Pierre Contour, M. Medici, J. Grenet, R. Papiernik, Ivan Schuller
Proceedings Volume 4058, (2000) https://doi.org/10.1117/12.397850
KEYWORDS: Oxygen, Thin films, Resistance, Superconductors, Temperature metrology, Electrons, Ultraviolet radiation, Visible radiation, Copper, Perovskite

Proceedings Article | 1 December 1990 Paper
Ivan Schuller, E. Fullerton, H. Vanderstraeten, Yvon Bruynseraede
Proceedings Volume 1324, (1990) https://doi.org/10.1117/12.22435
KEYWORDS: Multilayers, X-ray diffraction, Superlattices, Systems modeling, Kinematics, Crystals, Nonlinear crystals, Thin films, Diffraction, Sputter deposition

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