Mr. J. Warren Pickard Profile

J. Warren Pickard

Sr Program Manager at Trideum Corp

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 13 July 1998 Paper

Eglin virtual range database for hardware-in-the-loop testing

Sunjay Talele, J. Pickard, Monte Owens, Joseph Foster, John Watson, Mary Amenda Amick, Kenneth Anthony

Proc. SPIE. 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III

KEYWORDS: Weapons, Data modeling, Sensors, Databases, Image processing, Photography, 3D modeling, Volume rendering, Image classification, Hardware in the loop testing

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Proceedings Article | 20 June 1997 Paper

Sensor and detection algorithm-based clutter metrics

John Hilgers, William Vockel, William Reynolds, J. Pickard

Proc. SPIE. 3062, Targets and Backgrounds: Characterization and Representation III

KEYWORDS: Target detection, Detection and tracking algorithms, Sensors, Image sensors, Infrared signatures, Automatic target recognition, Missiles, Imaging infrared seeker, Thermal modeling, Systems modeling

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Proceedings Article | 17 June 1996 Paper

Methodology for creating three-dimensional terrain databases for use in IR signature modeling

Bryan Williams, J. Pickard

Proc. SPIE. 2742, Targets and Backgrounds: Characterization and Representation II

KEYWORDS: Data modeling, Databases, Satellites, Image processing, 3D modeling, Satellite imaging, Image classification, Infrared signatures, Missiles, Systems modeling

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SPIE Journal Paper | 1 February 1990

Effects of additive noise on four bar target detection as a function of contrast and spatial frequency

Ronald Driggers, Carl Halford, J. Pickard, Kevin Williams

OE Vol. 29 Issue 02

KEYWORDS: Spatial frequencies, Target detection, Imaging systems, Visualization, Forward looking infrared, Modulation transfer functions, Human vision and color perception, Electronics, Electro optical systems, Image quality

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Conference Committee Involvement (4)

Targets and Backgrounds XII: Characterization and Representation

17 April 2006 | Orlando (Kissimmee), Florida, United States

Targets and Backgrounds XI: Characterization and Representation

28 March 2005 | Orlando, Florida, United States

Targets and Backgrounds X: Characterization and Representation

12 April 2004 | Orlando, Florida, United States

Targets and Backgrounds IX: Characterization and Representation

21 April 2003 | Orlando, Florida, United States

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