Dr. Jack P. Salerno Profile

Dr. Jack P. Salerno

President at Agiltron Inc

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Author

Publications (5)

Proceedings Article | 21 May 2011 Paper

High-speed uncooled MWIR hostile fire indication sensor

G. Jin, L. Zhang, A. Mazurenko, S. Radhakrishnan, J. Salerno, F. Pantuso, M. Erdtmann

Proceedings Volume 8012, 801219 (2011) https://doi.org/10.1117/12.884591

KEYWORDS: Sensors, Mid-IR, Imaging systems, Infrared sensors, Infrared imaging, Flame detectors, Charge-coupled devices, Missiles, Infrared radiation, Cameras

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Proceedings Article | 4 May 2010 Paper

Photomechanical imager FPA design for manufacturability

P. Emelie, G. Simelgor, J. Salerno, Y. Liu, L. Zhang, S. Radhakrishnan, M. Erdtmann

Proceedings Volume 7660, 766017 (2010) https://doi.org/10.1117/12.850286

KEYWORDS: Imaging systems, Sensors, Thermography, Optics manufacturing, Reflectors, Infrared sensors, Mid-IR, Infrared radiation, Infrared imaging, Readout integrated circuits

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Proceedings Article | 7 May 2009 Paper

Optical readout photomechanical imager: from design to implementation

J. Salerno, S. Radhakrishnan, G. Simelgor, G. Jin, M. Erdtmann, L. Zhang

Proceedings Volume 7298, 72980I (2009) https://doi.org/10.1117/12.818815

KEYWORDS: Imaging systems, Thermography, Sensors, Reflectors, Infrared radiation, Bolometers, Absorption, Infrared sensors, Infrared imaging, Image processing

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Proceedings Article | 14 May 2007 Paper

High frame rate imaging using uncooled optical readout photomechanical IR sensor

Jack Salerno

Proceedings Volume 6542, 65421D (2007) https://doi.org/10.1117/12.718785

KEYWORDS: Imaging systems, Sensors, Infrared sensors, Infrared imaging, Visible radiation, Cameras, Mid-IR, Thermography, Infrared radiation, Readout integrated circuits

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Proceedings Article | 11 March 1996 Paper

Voltage imaging(TM) for L-contact panel testing

Mike Miller, Jack Salerno, Ying-Moh Liu, Francois Henley

Proceedings Volume 2651, (1996) https://doi.org/10.1117/12.235345

KEYWORDS: Defect detection, Manufacturing, Image processing, Image processing algorithms and systems, Image segmentation, Modulators, Scanning probe microscopy, Diodes, Resistors, LCDs

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