Dr. Jacob Elias
at CUSAT
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 August 2008 Paper
Jacob Elias, V. Rajesh, V. N. Narayan Namboothiri
Proceedings Volume 7064, 706408 (2008) https://doi.org/10.1117/12.795777
KEYWORDS: Speckle, Statistical analysis, Speckle pattern, Time series analysis, Metals, Surface finishing, Charge-coupled devices, Manufacturing, Data analysis, Dynamical systems

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