Prof. Jacob Scheuer
Senior Staff at Tel Aviv Univ
SPIE Involvement:
Conference Chair | Author | Editor
Publications (33)

Proceedings Article | 1 April 2020 Presentation + Paper
Proc. SPIE. 11344, Metamaterials XII
KEYWORDS: Gold, Metamaterials, Ellipsometry, Metals, Composites, Dielectrics, Silver, Reflectivity, Dielectric polarization, Perovskite

Proceedings Article | 26 February 2020 Paper
Proc. SPIE. 11296, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
KEYWORDS: Gold, Optical components, Microscopes, Beam steering, LIDAR, Antennas, Unmanned vehicles, Vehicle sensing

Proceedings Article | 1 March 2019 Paper
Proc. SPIE. 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
KEYWORDS: LIGO, Resonators, Lasers, Sensors, Interferometry, Phase shifts, Absorption

Proceedings Article | 22 February 2018 Paper
Proc. SPIE. 10548, Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
KEYWORDS: Slow light, Resonators, Dispersion, Structural design, Electrical engineering, Bandpass filters

Proceedings Article | 29 January 2018 Paper
Proc. SPIE. 10559, Broadband Access Communication Technologies XII
KEYWORDS: Fiber Bragg gratings, Fiber lasers, Quantum key distribution, Information security

Showing 5 of 33 publications
Proceedings Volume Editor (6)

Showing 5 of 6 publications
Conference Committee Involvement (12)
Optical and Quantum Sensing and Precision Metrology
6 March 2021 | San Francisco, California, United States
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
1 February 2020 | San Francisco, California, United States
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
2 February 2019 | San Francisco, California, United States
Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
29 January 2018 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
30 January 2017 | San Francisco, California, United States
Showing 5 of 12 Conference Committees
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