Dr. Jaehwang Jung
Staff Engineer at Samsung Electronics Co Ltd
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 15 March 2021 Presentation + Paper
Proc. SPIE. 11611, Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV

Proceedings Article | 11 March 2020 Presentation
Proc. SPIE. 11249, Quantitative Phase Imaging VI
KEYWORDS: Super resolution, Holography, Phase retrieval, Imaging systems, Microscopy, Image resolution, Reconstruction algorithms, Biomedical optics, Inspection, Diffraction

Proceedings Article | 9 March 2020 Presentation
Proc. SPIE. 11245, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII
KEYWORDS: Holography, Microscopy, Super resolution, Image resolution, Microscopes, Semiconductors, Stereoscopy, Optical semiconductors, Imaging devices, Wafer-level optics

Proceedings Article | 24 April 2017 Presentation
Proc. SPIE. 10074, Quantitative Phase Imaging III
KEYWORDS: Neuroscience, Magnetic resonance imaging, Positron emission tomography, Tissues, Brain, Neuroimaging, Alzheimer's disease, Pulsed laser operation, Image resolution, Phase imaging

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