Dr. James G. Shelnut Profile

Dr. James G. Shelnut

at Rohm and Haas Electronic Materials, LLC

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 11 March 2005 Paper

Progress toward board-level optical interconnect technology

Dan Lundy, Craig Allen, Luke Little, Nancy Chiarotto, Bruno Sicard, Hai Bin Zheng, Nick Pugliano, Tuan Ho, Matthew Moynihan, Phil Knudsen, Curtis Lustig, James Shelnut

Proceedings Volume 5731, (2005) https://doi.org/10.1117/12.594675

KEYWORDS: Waveguides, Silicon, Optical interconnects, Copper, Signal attenuation, Polymers, Optics manufacturing, Reliability, Epoxies, Lithography

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Proceedings Article | 10 June 2004 Paper

Progress toward the development of manufacturable integrated optical data buses

Jim Shelnut, John Fisher, Tuan Ho, Nancy Chiarroto, Matthew Moynihan, Bruno Sicard, Nathan Pawlowski, Nick Pugliano, Garo Khanarian, David Sherrer, Hai-Bin Zheng, Noel Heiks

Proceedings Volume 5358, (2004) https://doi.org/10.1117/12.526879

KEYWORDS: Waveguides, Optics manufacturing, Polymers, Integrated optics, Manufacturing, Plating, Connectors, Silicon, Metals, Data integration

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Proceedings Article | 10 November 2003 Paper

Recent developments in high-(Delta)N waveguides

R. Gore, S. Ibbitson, James Shelnut, Bruno Sicard, M. Gallagher, Garo Khanarian, A. Lamola, Matthew Moynihan, Yujian You, M. Talley

Proceedings Volume 5212, (2003) https://doi.org/10.1117/12.514841

KEYWORDS: Waveguides, Refractive index, Scattering, Cladding, Rayleigh scattering, Light scattering, Particles, Interfaces, Silicon, Semiconducting wafers

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Proceedings Article | 10 November 2003 Paper

Hybrid inorganic-organic aqueous base compatible waveguide materials for optical interconnect applications

Tuan Ho, Bruno Sicard, Garo Khanarian, James Shelnut, Matthew Moynihan, Craig Allen, Luke Little, Nathan Pawlowski, Hai Bin Zheng, Nick Pugliano

Proceedings Volume 5212, (2003) https://doi.org/10.1117/12.508142

KEYWORDS: Waveguides, Silicon, Optical interconnects, Lithography, Planar waveguides, Refractive index, Polymers, Scattering, Thermography, Birefringence

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