Dr. James Davis Trolinger
Vice President/Director of Research at MetroLaser Inc
SPIE Involvement:
Awards Committee | Conference Chair | Author | Editor
Publications (54)

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11490, Interferometry XX
KEYWORDS: Holograms, Digital holography, Holography, 3D image reconstruction, Machine learning, Particles, Microscopy, Imaging systems, Wavefronts, Microscopes

Proceedings Article | 22 April 2020 Presentation + Paper
Proc. SPIE. 11380, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XIV
KEYWORDS: Additive manufacturing, Metals, Finite element methods, Manufacturing, Spectroscopy, Vibrometry, Nondestructive evaluation, Aerospace engineering, Inspection, Doppler effect

Proceedings Article | 3 September 2019 Presentation + Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Laser Doppler velocimetry, 3D printing, Additive manufacturing, Finite element methods, Manufacturing

Proceedings Article | 7 September 2018 Paper
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Digital holography, Holograms, Particles, 3D image reconstruction, Holography, Crystals, Image resolution, Clouds, 3D image processing, Image processing

Proceedings Article | 18 August 2018 Presentation + Paper
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Manufacturing, Additive manufacturing, Laser Doppler velocimetry, Finite element methods, Doppler effect, Nondestructive evaluation, Vibrometry, Inspection, Acoustics, Printing

Showing 5 of 54 publications
Proceedings Volume Editor (10)

SPIE Conference Volume | 4 November 2019

SPIE Conference Volume | 11 December 2017

SPIE Conference Volume | 10 September 2015

SPIE Conference Volume | 29 September 2000

SPIE Conference Volume | 21 November 1997

Showing 5 of 10 publications
Conference Committee Involvement (19)
Applied Optical Metrology IV
1 August 2021 | San Diego, California, United States
Interferometry XX
24 August 2020 | Online Only, California, United States
Applied Optical Metrology III
13 August 2019 | San Diego, California, United States
Interferometry XIX
21 August 2018 | San Diego, California, United States
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Showing 5 of 19 Conference Committees
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