Dr. Jan Burke
Group Leader, Image-based Measurement Systems at Fraunhofer IOSB
SPIE Involvement:
Conference Program Committee | Author | Editor
Area of Expertise:
interferometry , phase shifting , precision calibrations , speckle interferometry , fringe analysis
Websites:
Profile Summary

Jan Burke received his Ph.D. from the university of Oldenburg, Germany, in 2000, with a thesis on "Application and Optimisation of the Spatial Phase Shifting Technique in Digital Speckle Interferometry". He then spent a year with MetroLaser Inc., Irvine, CA, where he worked on diverse research projects in optical metrology, such as laser vibrometry, digital holography, and phase-shifting fringe projection. In 2002 he joined the metrology team at the Australian Centre for Precision Optics (ACPO) at the Commonwealth Scientific and Industrial Research Organisation (CSIRO), Sydney, Australia, as a Senior Research Scientist. His current research activities include the development of new methods for phase-shifting interferometry, phase-map stitching, sphere and asphere metrology, three-flat testing, and various other characterisation issues in precision optics.
Publications (22)

Proceedings Article | 15 March 2023 Presentation + Paper
Proceedings Volume 12438, 124380P (2023) https://doi.org/10.1117/12.2648304
KEYWORDS: Cameras, Camera calibration, Calibration, Phase shifting, Machine learning, Image sensors, Process modeling, 3D modeling, 3D projection

Proceedings Article | 16 August 2019 Presentation
Proceedings Volume 11056, 1105612 (2019) https://doi.org/10.1117/12.2531869

Proceedings Article | 26 June 2017 Paper
Jan Burke, Liang Zhong
Proceedings Volume 10329, 103290T (2017) https://doi.org/10.1117/12.2269946
KEYWORDS: Structured light, Deflectometry, Fringe analysis, Phase shifts, Phase measurement, Interferometry, Modulation, Image processing, Optical metrology, Reflection

Proceedings Article | 17 July 2015 Paper
Proceedings Volume 9524, 952403 (2015) https://doi.org/10.1117/12.2183451
KEYWORDS: Interferometry, Deflectometry, Optical metrology, Light sources, Cameras, Spatial frequencies, Laser metrology, Laser optics, Calibration, Light emitting diodes

Proceedings Article | 18 August 2014 Paper
Proceedings Volume 9203, 92030C (2014) https://doi.org/10.1117/12.2063650
KEYWORDS: Deflectometry, Shearography, Mirrors, Cameras, Defect detection, Foam, Nondestructive evaluation, Imaging systems, Lightweight mirrors, Temperature metrology

Showing 5 of 22 publications
Proceedings Volume Editor (4)

SPIE Conference Volume | 29 October 2018

SPIE Conference Volume | 1 September 2016

SPIE Conference Volume | 18 July 2014

SPIE Conference Volume | 16 July 2012

Conference Committee Involvement (14)
Interferometry and Structured Light 2024
21 August 2024 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XIII
26 June 2023 | Munich, Germany
Interferometry XXI
24 August 2022 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Online Only, Germany
Interferometry XX
24 August 2020 | Online Only, California, United States
Showing 5 of 14 Conference Committees
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