Jan Meiser
at Karlsruher Institut für Technologie
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 19 March 2014 Paper
J. Meiser, M. Amberger, M. Willner, D. Kunka, P. Meyer, F. Koch, A. Hipp, M. Walter, F. Pfeiffer, J. Mohr
Proceedings Volume 9033, 903355 (2014) https://doi.org/10.1117/12.2043479
KEYWORDS: Silicon, X-rays, Phase contrast, X-ray imaging, Semiconducting wafers, Absorption, Biomedical optics, Scattering, Interferometry, Image restoration

Proceedings Article | 19 March 2014 Paper
Markus Schüttler, Andre Yaroshenko, Martin Bech, Guillaume Potdevin, Andreas Malecki, Michael Chabior, Johannes Wolf, Arne Tapfer, Jan Meiser, Danays Kunka, Maximilian Amberger, Jürgen Mohr, Franz Pfeiffer
Proceedings Volume 9033, 90334Y (2014) https://doi.org/10.1117/12.2042892
KEYWORDS: Phase shifts, Visibility, Binary data, X-rays, X-ray imaging, Interferometers, Interferometry, Optical design, Sensors, Absorption

Proceedings Article | 6 March 2013 Paper
T. Thüring, S. Hämmerle, S. Weiss, J. Nüesch, J. Meiser, J. Mohr, C. David, M. Stampanoni
Proceedings Volume 8668, 866813 (2013) https://doi.org/10.1117/12.2006865
KEYWORDS: Interferometers, X-ray computed tomography, X-rays, Phase contrast, Sensors, Imaging systems, Visibility, Absorption, Interferometry, Image resolution

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