Jason L. Woolman
at Univ of California/Los Angeles
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 August 2003 Paper
Proceedings Volume 5053, (2003) https://doi.org/10.1117/12.484707
KEYWORDS: Annealing, Nickel, Temperature metrology, Thin films, Titanium, Crystals, Sputter deposition, Shape memory alloys, Heat treatments, Atrial fibrillation

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