Dr. Jean-Luc Mutz
Process Director at Photonis France SAS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 February 2007 Paper
Jean-Luc Mutz, Olivier Bonnet, Ray Fairbend, Emile Schyns, Julien Seguy
Proceedings Volume 6479, 64790F (2007) https://doi.org/10.1117/12.699576
KEYWORDS: X-rays, X-ray optics, Glasses, Etching, Optics manufacturing, X-ray imaging, Metrology, X-ray technology, Aerospace engineering, Reflectivity

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