Dr. Jean-Pierre Moeglin Profile

Dr. Jean-Pierre Moeglin

Business Development Manager at Institut Franco-Allemand de Recherches de Saint-Louis

SPIE Involvement:

Author

Proceedings Article | 11 May 2015 Paper

Bio-inspired approach for intelligent unattended ground sensors

Nicolas Hueber, Pierre Raymond, Christophe Hennequin, Maxime Perrot, Philippe Voisin, Alexander Pichler, Jean-Pierre Moeglin

Proceedings Volume 9494, 94940S (2015) https://doi.org/10.1117/12.2177400

KEYWORDS: Sensors, Cameras, Unattended ground sensors, Field programmable gate arrays, Artificial intelligence, Neurons, Biomimetics, Motion analysis, Prototyping, Visualization

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Proceedings Article | 10 June 2014 Paper

Real-time movement detection and analysis for video surveillance applications

Nicolas Hueber, Christophe Hennequin, Pierre Raymond, Jean-Pierre Moeglin

Proceedings Volume 9079, 90790B (2014) https://doi.org/10.1117/12.2049833

KEYWORDS: Motion analysis, Sensors, Prototyping, Surveillance, Cameras, Video surveillance, Statistical analysis, Algorithm development, Smart sensors, Video

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Proceedings Article | 20 April 2010 Paper

Bistatic range-gated active imaging in vehicles with LEDs or headlights illumination

F. Christnacher, J.-M. Poyet, J.-P. Moeglin, M. Laurenzis, F. Taillade

Proceedings Volume 7675, 76750J (2010) https://doi.org/10.1117/12.852895

KEYWORDS: Light emitting diodes, Imaging systems, Cameras, Roads, Headlamps, Visibility through fog, Visibility, Fiber optic illuminators, Fiber optic gyroscopes, Sensors

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Proceedings Article | 29 April 2009 Paper

Nanothermites for space and defence applications

Denis Spitzer, Jean-Pierre Moeglin, Marc Comet

Proceedings Volume 7314, 73140N (2009) https://doi.org/10.1117/12.821334

KEYWORDS: Oxides, Nanoparticles, Aluminum, Particles, Combustion, Composites, Explosives, Defense and security, Nanolithography, Tungsten

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Proceedings Article | 13 October 2005 Paper

Laser-induced damage behaviour of different kind of germanium

K. Diener, P. Ambs, J.-P. Moeglin, L. Gernandt

Proceedings Volume 5989, 59890G (2005) https://doi.org/10.1117/12.628966

KEYWORDS: Germanium, Laser irradiation, Temperature metrology, Laser damage threshold, Nd:YAG lasers, Laser induced damage, Pulsed laser operation, Moire patterns, 3D modeling, Optical simulations

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Proceedings Article | 1 September 2004 Paper

Laser-induced optronic countermeasure against charge-coupled devices and optronic counter-countermeasure in the visible region and infrared region

Alain Boffy, Jean-Pierre Moeglin, Alain Dieterlen, Nicolas Hueber

Proceedings Volume 5417, (2004) https://doi.org/10.1117/12.537520

KEYWORDS: Charge-coupled devices, Cameras, Optoelectronics, Pulsed laser operation, Objectives, Diffusion, Staring arrays, Laser countermeasures, Silicon, Video

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Proceedings Article | 15 July 2004 Paper

Study of the influence of the Nd:YAG laser irradiation on the thermal-optical parameters of germanium

K. Diener, L. Gernandt, Pierre Ambs, Jean-Pierre Moeglin

Proceedings Volume 5506, (2004) https://doi.org/10.1117/12.579996

KEYWORDS: Germanium, Nd:YAG lasers, Temperature metrology, Laser damage threshold, Laser irradiation, Laser energy, Pyrometry, Moire patterns, Laser induced damage, Sensors

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Proceedings Article | 13 September 2002 Paper

Physics of high-average-power repetitively pulsed laser ablation of dielectric materials

Ruediger Schmitt, Harmut Borchert, Manfred Hugenschmidt, Jean-Pierre Moeglin, Karl Daree

Proceedings Volume 4760, (2002) https://doi.org/10.1117/12.482077

KEYWORDS: Plasma, Pulsed laser operation, Laser ablation, Sensors, Energy transfer, Modulation transfer functions, Dielectrics, Numerical simulations, Active optics, Optoelectronics

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Proceedings Article | 25 January 2001 Paper

HgCdTe energy gap modification due to laser irradiation

A. Boffy, Bernard Gautier, Jean-Pierre Moeglin

Proceedings Volume 4184, (2001) https://doi.org/10.1117/12.414016

KEYWORDS: Sensors, Laser irradiation, Carbon dioxide lasers, Laser beam diagnostics, Photodetectors, Mercury, Mercury cadmium telluride, Continuous wave operation, Laser damage threshold, Cadmium

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Proceedings Article | 8 April 1998 Paper

Photoelectric performance degradation of several laser-irradiated Si detectors

Jean-Pierre Moeglin, Bernard Gautier, Rene Joeckle, Dominique Bolmont

Proceedings Volume 3287, (1998) https://doi.org/10.1117/12.304506

KEYWORDS: Sensors, Boron, Brain-machine interfaces, Dye lasers, Liquids, Diffusion, Silicon, Laser irradiation, Nd:YAG lasers, Semiconductor lasers

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Proceedings Article | 4 April 1997 Paper

Electrical behavior of laser damaged silicon photodiodes

Jean-Pierre Moeglin, Bernard Gautier, Rene Joeckle

Proceedings Volume 3092, (1997) https://doi.org/10.1117/12.270159

KEYWORDS: Sensors, Silicon, Photodiodes, Semiconductor lasers, Diffusion, Thermal modeling, Laser induced damage, Active sensors, Visible radiation, Pulsed laser operation

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