Jeff Clayhold
at SRI International
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 August 2024 Presentation + Paper
April Jewell, Todd Jones, Michael Hoenk, Jeff Clayhold, John Tower
Proceedings Volume 13103, 131030Q (2024) https://doi.org/10.1117/12.3018500
KEYWORDS: CMOS sensors, Superlattices, Semiconducting wafers, Image sensors, Silicon, Design, Quantum efficiency, Modulation transfer functions, Doping, Antireflective coatings

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