Jeff Earls
at TriLumina Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 February 2020 Paper
Proc. SPIE. 11300, Vertical-Cavity Surface-Emitting Lasers XXIV
KEYWORDS: 3D-TOF imaging, Vertical cavity surface emitting lasers, Epitaxy, Semiconducting wafers, Manufacturing, Reliability, Standards development, LIDAR, Humidity, Particles

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