Jeff Gelb
at Sigray Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 17 September 2019 Presentation
Proc. SPIE. 11113, Developments in X-Ray Tomography XII
KEYWORDS: X-ray optics, Imaging systems, Lenses, Scanners, X-rays, X-ray sources, Spectrometers, X-ray imaging, X-ray fluorescence spectroscopy, Resolution enhancement technologies

Proceedings Article | 20 September 2010 Paper
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Lithography, Refractive index, Stereoscopy, Polymers, X-rays, Reflectivity, Image resolution, Photonic crystals, X-ray imaging, Absorption

Proceedings Article | 22 May 2009 Paper
Proc. SPIE. 7378, Scanning Microscopy 2009
KEYWORDS: X-ray computed tomography, Cartilage, Tissues, X-rays, Organisms, Image resolution, Bone, Tomography, Tissue optics, 3D image processing

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