Dr. Jeffrey A. Klug
at Argonne National Lab
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 9 September 2019 Presentation
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: X-rays, Data acquisition, Image quality, Data processing, Integrated circuits, Spatial resolution, X-ray imaging, Image quality standards, Motion controllers

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Diffraction, Synchrotron radiation instrumentation, Microscopy, Interferometry, Phase retrieval, X-ray imaging

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Coherence imaging, Capillaries, X-rays, X-ray diffraction, Data acquisition, Reconstruction algorithms, Monochromators, X-ray imaging

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