Dr. Jeffrey L. Guttman Profile

Dr. Jeffrey L. Guttman

Technology Director at Ophir a division of MKS Instruments

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Publications (3)

Proceedings Article | 18 March 2016 Paper

Development of a non-contact diagnostic tool for high power lasers

Jed Simmons, Jeffrey Guttman, John McCauley

Proceedings Volume 9741, 97410N (2016) https://doi.org/10.1117/12.2213605

KEYWORDS: Diagnostics, High power lasers, Sensors, Signal to noise ratio, Near infrared, Silicon, Cameras, Imaging systems, Optical testing, Laser cutting, Laser scattering, Head, Light scattering

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Proceedings Article | 5 March 2008 Paper

Instantaneous measurement of M2 beam propagation ratio in real-time

Allen Cary, Jeffrey Guttman, Razvan Chirita, Derrick Peterman

Proceedings Volume 6871, 687103 (2008) https://doi.org/10.1117/12.763661

KEYWORDS: Laser beam propagation, Optical testing, Beam propagation method, CCD cameras, Cameras, Pulsed laser operation, Semiconductor lasers, Solid state lasers, Wave propagation, Nd:YAG lasers

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Proceedings Article | 30 May 2003 Paper

Characterization of the near-field profile of semiconductor lasers and the spot size of tightly focused laser beams from far-field measurements

Jeffrey Guttman, John Fleischer

Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.472393

KEYWORDS: Near field, Cameras, Vertical cavity surface emitting lasers, Semiconductor lasers, Fourier transforms, CCD cameras, Radiometry, Diffraction, Optical fibers, Phase retrieval

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