Dr. Jeffry J. Sniegowski
VP Production at Sandia National Labs
SPIE Involvement:
Author
Publications (22)

Proceedings Article | 20 October 2004 Paper
Keith Rebello, Bradley Boone, Bernard Kluga, Robert Osiander, Jeffry Sniegowski, Jonathan Bruzzi, Chris Drabenstadt, Steven Rodgers, Margaret Darrin, Eric Rogala
Proceedings Volume 5550, (2004) https://doi.org/10.1117/12.562819
KEYWORDS: Micromirrors, Mirrors, Microelectromechanical systems, Oxides, Digital signal processing, Transmitters, Space operations, CMOS cameras, Charge-coupled devices, Imaging systems

SPIE Journal Paper | 1 October 2003 Open Access
Jeffry Sniegowski, James Smith
JM3, Vol. 2, Issue 04, (October 2003) https://doi.org/10.1117/12.10.1117/1.1616574

Proceedings Article | 30 August 1999 Paper
Jerome Jakubczak, John McBrayer, Lloyd Irwin, Stephen Montague, James Smith, Harold Stewart, Maarten de Boer, Siv Limary, Jeffry Sniegowski
Proceedings Volume 3874, (1999) https://doi.org/10.1117/12.361210
KEYWORDS: Resistance, Semiconducting wafers, Oxides, Microelectromechanical systems, Etching, Silicon, Scanning electron microscopy, Diagnostics, Computer aided design, Standards development

Proceedings Article | 30 August 1999 Paper
Sita Mani, Jeffry Sniegowski, James Fleming
Proceedings Volume 3874, (1999) https://doi.org/10.1117/12.361215
KEYWORDS: Tungsten, Silicon, Microelectromechanical systems, Coating, Resonators, Oxides, Semiconducting wafers, Photomicroscopy, Chemical vapor deposition, Deposition processes

Proceedings Article | 13 October 1998 Paper
Dale Hetherington, Jeffry Sniegowski
Proceedings Volume 3440, (1998) https://doi.org/10.1117/12.326692
KEYWORDS: Chemical mechanical planarization, Oxides, Micromirrors, Mirrors, Surface finishing, Adaptive optics, Polishing, Photography, Profilometers, Chemical elements

Showing 5 of 22 publications
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