Dr. Jens Viefhaus Profile

Dr. Jens Viefhaus

at Helmholtz-Zentrum Berlin

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Author

Publications (3)

Proceedings Article | 9 June 2023 Presentation

Short-pulse diagnostics at the attosecond frontier for EuXFEL and FLASH (Conference Presentation)

Markus Ilchen, Sadia Bari, Thomas Baumann, Christopher Behrens, Yilmaz Bican, Mahdi Bidhendi, Rebecca Boll, Markus Braune, Günter Brenner, Francesca Callegari, Alberto De Fanis, Markus Degenhardt, Kristina Dingel, Stefan Düsterer, Felix Egun, Arno Ehresmann, Benjamin Erk, Lars Funke, Andreas Galler, Gianluca Geloni, Gesa Götzke, Tais Gorkhover, Jan Grünert, Patrik Grychtol, Marc Guetg, Andreas Hans, Arne Held, Ruda Hindrikson, Moritz Hoesch, Till Jahnke, Fini Jastrow, Reinhard Kienberger, Joakim Laksman, Mats Larsson, Jia Liu, Jon Marangos, Lutz Marder, David Meier, Michael Meyer, Najmeh Mirian, Jacobo Montano, Terence Mullins, Valerija Music, Christian Ott, Thorsten Otto, Yevheniy Ovcharenko, Steffen Palutke, Christopher Passow, Thomas Pfeifer, Nils Rennhack, Daniel Rivas, Daniel Rolles, Artem Rudenko, Patrick Rupprecht, Sara Savio, Albert Schletter, Frank Scholz, Jörn Seltmann, Svitozar Serkez, Philipp Schmidt, Evgeny Schneidmiller, Bernhard Sick, Richard Thomas, Sergey Usenko, Jens Viefhaus, Peter Walter, Vincent Wanie, Niclas Wieland, Lasse Wülfing, Mikhail Yurkov, Vitali Zhaunerchyk, Kai Tiedtke, Wolfram Helml

Proceedings Volume PC12581, PC1258108 (2023) https://doi.org/10.1117/12.2669164

KEYWORDS: Diagnostics, X-rays, X-ray technology, Structural dynamics, Photonics, Nonlinear dynamics, Liquid crystal lasers

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Proceedings Article | 21 August 2020 Presentation + Paper

Reconstruction of offsets of an electron gun using deep learning and an optimization algorithm

David Meier, Gregor Hartmann, Jens Völker, Jens Viefhaus, Bernhard Sick

Proceedings Volume 11493, 114930E (2020) https://doi.org/10.1117/12.2568001

KEYWORDS: Reconstruction algorithms, Optimization (mathematics), Pulsed laser operation, Monte Carlo methods, Neural networks, Electron beams, Stochastic processes, Machine learning

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Proceedings Article | 9 September 2019 Presentation + Paper

On the characterization of ultra-precise XUV-focusing mirrors by means of slope- measuring deflectometry

Frank Siewert, Jana Buchheim, Grzegorz Gwalt, Jens Viefhaus

Proceedings Volume 11109, 111090N (2019) https://doi.org/10.1117/12.2529308

KEYWORDS: Mirrors, Deflectometry, Synchrotrons, Ion beams, Ion beam finishing, Nano opto mechanical systems, Spatial resolution, Photons, Optics manufacturing, Ray tracing

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