Jeong Yub Lee
at Samsung Advanced Institute of Technology
SPIE Involvement:
Publications (7)

Proceedings Article | 21 August 2020 Presentation
Proc. SPIE. 11467, Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII
KEYWORDS: Dielectrics, Wavefront analysis, Wavefronts, Monochromatic aberrations, Geometrical optics, Nanostructures, Lenses, Wavefront sensors, Finite-difference time-domain method, Phase shift keying

Proceedings Article | 23 May 2018 Presentation
Proc. SPIE. 10671, Metamaterials XI
KEYWORDS: Wavefronts, Dielectrics, Lenses, Geometrical optics, Nanostructures, Imaging systems, Consumer electronics, Optical storage, Digital cameras, Microscopes

Proceedings Article | 14 March 2018 Presentation
Proc. SPIE. 10549, Complex Light and Optical Forces XII
KEYWORDS: Waveguides, Spiral phase plates, Lithography, Control systems, Silicon photonics, Channel waveguides, Phase velocity, Integrated optics, Infrared microscopy, Spectrum analysis

Proceedings Article | 31 August 2017 Paper
Proc. SPIE. 10354, Nanoengineering: Fabrication, Properties, Optics, and Devices XIV
KEYWORDS: Dielectrics, Refractive index, Sputter deposition, Phase shifts, Nanostructures, Oxygen, Radium, Optical components, Surface roughness, Transparency

Proceedings Article | 15 September 2016 Presentation + Paper
Proc. SPIE. 9927, Nanoengineering: Fabrication, Properties, Optics, and Devices XIII
KEYWORDS: Silicon, Refractive index, Annealing, Oxides, Thin films, Nanostructures, Surface roughness, Crystals, Silicon films, Plasma enhanced chemical vapor deposition

Showing 5 of 7 publications
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