Dr. Jérôme M. Vaillant
at CEA-LETI
SPIE Involvement:
Author
Area of Expertise:
CMOS image sensor , Optical simulation , Wavefront sensor , Adaptive Optics
Publications (18)

Proceedings Article | 26 March 2019 Paper
Proc. SPIE. 10958, Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019
KEYWORDS: Lithography, Diffraction, Microlens array, Chromium, 3D modeling, Atomic force microscopy, Microlens, Photomasks, Photoresist processing, Grayscale lithography

Proceedings Article | 24 May 2018 Presentation + Paper
Proc. SPIE. 10677, Unconventional Optical Imaging
KEYWORDS: Signal to noise ratio, Near infrared, Sensors, Databases, Reflectivity, Image sensors

Proceedings Article | 24 January 2011 Paper
Proc. SPIE. 7876, Digital Photography VII
KEYWORDS: Signal to noise ratio, Visualization, Cameras, Sensors, Image processing, Image resolution, Colorimetry, Image sensors, Optical resolution, RGB color model

Proceedings Article | 24 January 2011 Paper
Proc. SPIE. 7876, Digital Photography VII
KEYWORDS: Optical filters, Optical lithography, Sensors, Metals, Silicon, Quantum efficiency, Image resolution, Image sensors, Optical resolution, Transistors

Proceedings Article | 24 January 2011 Paper
Proc. SPIE. 7876, Digital Photography VII
KEYWORDS: Signal to noise ratio, CMOS sensors, Cameras, Sensors, Image processing, Quantum efficiency, Image quality, Image sensors, Microlens, Device simulation

Showing 5 of 18 publications
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