Dr. Jerome B. Franck Profile

Dr. Jerome B. Franck

Retired

SPIE Involvement:

Author

Proceedings Article | 30 December 2008 Paper

TIR-based photothermal/photoacoustic deflection

Wolfgang Riede, Paul Allenspacher, J. Franck

Proceedings Volume 7132, 71320S (2008) https://doi.org/10.1117/12.804092

KEYWORDS: Photoacoustic spectroscopy, Acoustics, Helium neon lasers, Plasma, Laser beam diagnostics, Pulsed laser operation, Reflection, Prisms, Wave propagation, Nd:YAG lasers

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Proceedings Article | 2 May 2007 Paper

Angularly sensitive wide field of view micro-sensor construction and new processing paradigm: task oriented optical processing

Jerome Franck

Proceedings Volume 6561, 656109 (2007) https://doi.org/10.1117/12.721117

KEYWORDS: Chemical elements, Sensors, Ultraviolet radiation, Image processing, Staring arrays, Optical components, Optical signal processing, Polarimetry, Excimer lasers, Manufacturing

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Discussed is a novel method of manufacturing an Angularly Sensitive Micro-Sensor (ASMS). The process employed utilizes excimer laser ablation to write out the microlens on the curved surface of the master lens. This master lens element is manufactured with fused optical fibers, such that if the registration is maintained, the light from each microlens goes via the fiber to a specific pixel in a focal plane array (FPA). Such a system allows for a field of view greatly in excess of 180 degrees. If local imaging is required for specific tasks the fiber can send the angularly localized image to a pixel set. Image fusing may then be required. Infrared and ultraviolet versions can be manufactured. A more general application allows for a multi-spectral sensor. After one ASMS is constructed, then an inverse mask (mould) can be created and the monolithic sphere, retaining its registration, is covered in liquid plastic and placed into the mould and the exact replica is re-created. The advantage is low cost and rapid manufacture of the ASMS. The paper focuses on this sensor as a Task-Oriented Optical Processing (TOP) system; where the processing is performed primarily by the optics leaving a greatly reduced requirement for an electronic processor. This is a critical issue for micro, insect sized platforms where the weight budget is devoted to the energy and propulsive systems. An important aspect of this approach is that the sensor samples amplitude and angular space rather than amplitude and position space as conventional sensors currently do. This makes the ASMS processing paradigm completely different from conventional image processing. For example using several fiber/pixel elements to comprise a UV polarimeter allows for simple storage and processing of vector elements for simple navigation. The home position may be treated as "Look up table" reference matrix (RM). That base table can be modified to account for the passage of time (and hence change in solar position from the UV polarimeter, as appropriate). A second "real time" travel matrix (TRM) is then created. Eventually, a target matrix (TAM) would also be created. Simply driving changes in the TRM towards the RM would be used for navigating the return trip back to home base. When the difference between the two matrices goes to a null matrix the platform would be home.

Proceedings Article | 21 August 2003 Paper

Asymmetrical virtual telecentric laser diode line/array source model for use in microlaser pumping design and analysis

Jerome Franck

Proceedings Volume 5087, (2003) https://doi.org/10.1117/12.487553

KEYWORDS: Diodes, Semiconductor lasers, Systems modeling, Performance modeling, Lens design, Geometrical optics, Visual process modeling, Optical design, Optical pumping, Laser systems engineering

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Proceedings Article | 1 July 1999 Paper

Extended microwave-to-optical transformation (MOT) method for electric field analysis of microwave circuits and components

Charmaine Franck, Jerome Franck, Lewis DeSandre

Proceedings Volume 3702, (1999) https://doi.org/10.1117/12.351216

KEYWORDS: Waveguides, Microwave radiation, Thin films, Finite element methods, Interfaces, Transformers, Dielectrics, Magnetism, Multilayers, Free space

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Proceedings Article | 27 May 1996 Paper

Nd:YAG laser-induced damage on ultrathin silicon samples

Wolfgang Riede, Jerome Franck

Proceedings Volume 2714, (1996) https://doi.org/10.1117/12.240396

KEYWORDS: Silicon, Semiconducting wafers, Nd:YAG lasers, Beam analyzers, Charge-coupled devices, Laser induced damage, Surface finishing, Semiconductor lasers, Photomicroscopy, Laser beam diagnostics

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Proceedings Article | 1 March 1996 Paper

Defect-dominated 1.06-um laser-induced damage of antireflectance coatings designed for use at 1.3 um

Wolfgang Riede, Jerome Franck

Proceedings Volume 2713, (1996) https://doi.org/10.1117/12.234184

KEYWORDS: Optical coatings, Laser induced damage, Carbon, Contamination, Surface finishing, Particles, Absorption, Photomicroscopy, Electron microscopes, Adsorption

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Proceedings Article | 1 December 1991 Paper

Preliminary study of the admittance diagram as a useful tool in the design of stripline components at microwave frequencies

Charmaine Franck, Jerome Franck

Proceedings Volume 1527, (1991) https://doi.org/10.1117/12.48658

KEYWORDS: Thin films, Microwave radiation, Phase shifts, Reflectivity, Optical design, Glasses, Optical engineering, Refractive index, Multilayers, Thin film coatings

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Proceedings Article | 1 December 1991 Paper

Simple design considerations for binary optical holographic elements

Jerome Franck, Van Hodgkin

Proceedings Volume 1555, (1991) https://doi.org/10.1117/12.50622

KEYWORDS: Optical components, Binary data, Optical design, Holography, Optics manufacturing, Chemical elements, Diffraction, Refraction, Geometrical optics, Ray tracing

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Proceedings Article | 1 November 1990 Paper

Structural modification of D20/H2O-dosed CaF2 optical thin films

J. Franck

Proceedings Volume 1438, 14381D (1990) https://doi.org/10.1117/12.2294458

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SPIE Journal Paper | 1 October 1986

Defect Characteristics Of Optical Surfaces Using Pulsed Laser Damage Methods

J. Porteus, J. Franck, S. Seitel, S. Allen

OE, Vol. 25, Issue 10, 251171, (October 1986) https://doi.org/10.1117/12.10.1117/12.7973973

KEYWORDS: Laser induced damage, Laser optics, Failure analysis, Laser development

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Proceedings Article | 3 September 1985 Paper

Scanning Electron Microscopy Studies Of Laser Damage Initiating Defects In ZnSe/ThF[sub]4[/sub] And SiH/Si0[sub]2[/sub] Multilayer Coatings

L. Johnson, E. Ashley, T. Donovan, J. Franck, R. Woolever, R. Dalbey

Proceedings Volume 0525, (1985) https://doi.org/10.1117/12.946354

KEYWORDS: Laser induced damage, Multilayers, Mirrors, Scanning electron microscopy, Polishing, Surface finishing, Optical coatings, Hydrogen fluoride lasers, Gold, Oxygen

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Proceedings Article | 3 September 1985 Paper

Defect Characteristics Of Optical Surfaces Using Pulsed Laser Damage Methods

J. Porteus, J. Franck, S. Seitel, S. Allen

Proceedings Volume 0525, (1985) https://doi.org/10.1117/12.946343

KEYWORDS: Data modeling, Laser induced damage, Failure analysis, Optical coatings, Information operations, Mirrors, Laser development, Surface finishing, Resistance, Laser damage threshold

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Proceedings Article | 8 February 1985 Paper

Method For Monitoring The Change In Relative Transmittance Of Small-Spot Laser-Damaged Optics At 10.6 pm

J. Franck, J. Porteus, S. Seitel, V. Hodgkin, W. Faith

Proceedings Volume 0499, (1985) https://doi.org/10.1117/12.971077

KEYWORDS: Transmittance, Germanium, Laser induced damage, Coating, Laser optics, Aluminum, Mirrors, Reflectivity, Optical testing, Carbon dioxide lasers

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Proceedings Article | 9 January 1984 Paper

Process For Producing Laser-Formed Video Fiducials And Reticles

J. Franck, P. Keller, R. Swing, G. Silberberg

Proceedings Volume 0432, (1984) https://doi.org/10.1117/12.936646

KEYWORDS: Video, Calibration, Cameras, Reticles, Photoresistors, Distortion, Pulsed laser operation, Video processing, Nd:YAG lasers, Laser marking

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Proceedings Article | 26 February 1982 Paper

Technique For Increasing The Optical Strength Of Single-Crystal NaCI Through Temperature Cycling

Jerome Franck, MJ Soileau

Proceedings Volume 0297, (1982) https://doi.org/10.1117/12.932503

KEYWORDS: Heat treatments, Laser damage threshold, Laser induced damage, Crystals, Laser crystals, Quartz, Singular optics, Nitrogen, Temperature metrology, Nd:YAG lasers

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Showing 5 of 15 publications

Conference Committee Involvement (6)

Boulder Damage Symposium XXXIX: Annual Symposium on Optical Materials for High Power Lasers

24 September 2007 | Boulder, Colorado, United States

Boulder Damage Symposium XXXVIII: Annual Symposium on Optical Materials for High Power Lasers

26 September 2006 | Boulder, Colorado, United States

Boulder Damage Symposium XXXVII: Annual Symposium on Optical Materials for High Power Lasers

19 September 2005 | Boulder, CO, United States

Boulder Damage Symposium XXXVI

20 September 2004 | Boulder, Colorado, United States

XXXIV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium

22 September 2003 | Boulder, Colorado, United States

Showing 5 of 6 Conference Committees

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