Jiang Chen
at Shanghai Aerospace Equipments Manufacturer Co., Ltd.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 November 2019 Paper
Proceedings Volume 11196, 111961R (2019) https://doi.org/10.1117/12.2538805
KEYWORDS: Silicon, Transmittance, Fabry–Perot interferometers, Antireflective coatings, Reflectivity, Refractive index, Autoregressive models, Mirrors, Reflectors, Titanium dioxide

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