Dr. Jie Zhao
at Beijing Univ of Technology
SPIE Involvement:
Author
Publications (43)

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11434, 2019 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
KEYWORDS: Light sources, Light emitting diodes, Imaging systems, Image processing, Imaging technologies, Microscopy, Image quality, Deconvolution, Reconstruction algorithms, Light

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Thin films, Calibration, Ultrasonography, Particles, Demodulation, Ultrasonics, Transducers, Acoustics, Spherical lenses, Positron emission tomography

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Detection and tracking algorithms, Modulation, Sensors, Gases, Semiconductor lasers, Infrared radiation, Absorption spectroscopy, Carbon monoxide, Signal detection, Absorption

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11188, Holography, Diffractive Optics, and Applications IX
KEYWORDS: Diffraction, Beam splitters, Holograms, Digital holography, Reflection, Sensors, Reflectivity, Image resolution, Transmittance, Michelson interferometers

Proceedings Article | 9 November 2018 Paper
Proc. SPIE. 10826, Infrared, Millimeter-Wave, and Terahertz Technologies V
KEYWORDS: Refractive index, Continuous wave operation, Axicons, Gaussian beams, Millimeter wave imaging, Imaging systems, Sensors, Terahertz radiation, Bessel beams, Beam analyzers

Showing 5 of 43 publications
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