Prof. Jin Zhou Profile

Prof. Jin Zhou

at Chongqing Institute of Metrology and Quality Inspection

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Author

Publications (10)

Proceedings Article | 13 December 2024 Paper

Automatic measurement of particle size based on scanning electron microscopy

Lei Tao, Chong Yue, Jin Zhou, Jing Zheng, Wei Zhang

Proceedings Volume 13500, 135000B (2024) https://doi.org/10.1117/12.3048148

KEYWORDS: Particles, Scanning electron microscopy, Calibration, Edge detection, Microspheres, Image analysis, Electron microscopes, Time metrology, Statistical analysis, Reflection

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Proceedings Article | 4 December 2024 Paper

Characterization of wafer surface morphology based on atomic force microscopy

Yueqing Ding, Chong Yue, Lei Tao, Long Chen, Jin Zhou

Proceedings Volume 13283, 132832I (2024) https://doi.org/10.1117/12.3036788

KEYWORDS: Semiconducting wafers, Atomic force microscopy, Surface roughness, Interferometers, Semiconductors, Microelectronics, Optical surfaces, Atomic force microscope, Time metrology

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Proceedings Article | 20 November 2024 Paper

The performance evaluation for dimensional measurements with industrial computed tomography systems

Lei Tao, Chunlin Huo, Jin Zhou, Sen Zhou

Proceedings Volume 13241, 132410R (2024) https://doi.org/10.1117/12.3037029

KEYWORDS: Computed tomography, Manufacturing, Metrology, 3D metrology, X-ray computed tomography, Computing systems, X-rays, X-ray imaging, Measurement uncertainty, Calibration

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Proceedings Article | 18 November 2024 Paper

Determination of the characteristic parameter of nanofilm based on ellipsometer and scanning electron microscope

Chong Yue, Lei Tao, Jin Zhou, Jun Xiong, Weifen He

Proceedings Volume 13398, 1339814 (2024) https://doi.org/10.1117/12.3049736

KEYWORDS: Film thickness, Thin films, Scanning electron microscopy, Ellipsometry, Electron microscopes, Nanofilms, Reflection, Systems modeling, Dispersion, Mathematical modeling

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Proceedings Article | 1 December 2023 Paper

Mechanical properties of shape memory alloys (SMA) actuator of bionic flexible dexterous hand

Yingqian Ni, Jin Zhou, Lei Tao, Yu Yan, Tong Liu, Wenbin Zhang

Proceedings Volume 12940, 129400U (2023) https://doi.org/10.1117/12.3010715

KEYWORDS: Shape memory alloys, Actuators, Materials properties, Biomimetics, Temperature metrology, Mathematical modeling, Design and modelling, Alloys, Finite element methods, Elasticity

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Proceedings Article | 27 November 2023 Paper

Automated sampling path planning model for complex surface of cylinder gear based on laser scanning techniques

Sen Zhou, Xiaohong Ran, Lei Tao, Jin Zhou, Qiqiang Tong

Proceedings Volume 12769, 127690J (2023) https://doi.org/10.1117/12.2684550

KEYWORDS: Teeth, 3D metrology, Laser scanners, Manufacturing, Beam path, Metrology, Inspection, 3D modeling, Industry, Data processing

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Proceedings Article | 4 April 2023 Paper

Research on measurement method of submicron linewidth based on microscopic vision

Chong Yue, YueQing Ding, Lei Tao, Xin Chen, Jin Zhou

Proceedings Volume 12617, 1261770 (2023) https://doi.org/10.1117/12.2666760

KEYWORDS: Image processing, Digital filtering, Technology, Nonlinear filtering, Image filtering, Hough transforms, Calibration, Computing systems, Standards development, Imaging systems

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Proceedings Article | 4 April 2023 Paper

Measurement of optical constants of nano-film based on ellipsometric data at visible wavelength

Chong Yue, YueQing Ding, Lei Tao, Jin Zhou, Xin Chen

Proceedings Volume 12617, 126176Y (2023) https://doi.org/10.1117/12.2666758

KEYWORDS: Particle swarm optimization, Ellipsometry, Refractive index, Particles, Thin films, Evolutionary algorithms, Thin film devices, Optical testing, Mathematical optimization, Reflection

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Proceedings Article | 9 March 2023 Paper

Research and application of gauge block intelligent measurement system based on inductance micrometer

Jin Zhou, Tingting Ren, Lei Tao, Tao Zhang, Long Chen

Proceedings Volume 12600, 126000W (2023) https://doi.org/10.1117/12.2674002

KEYWORDS: Intelligence systems, Sensors, Calibration, Inductance, Error control coding, Metrology

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Proceedings Article | 9 October 2021 Poster + Paper

2D sizing measuring system of regular particles by semi-automatic image analysis technique

Sen Zhou, Long Chen, Jin Zhou, Yu Yan

Proceedings Volume 11896, 118960Q (2021) https://doi.org/10.1117/12.2600718

KEYWORDS: Particles, Shape analysis, Image analysis, Particle systems, Atmospheric particles, 3D metrology, Transmission electron microscopy, Scanning electron microscopy, Spherical lenses, Laser applications

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Showing 5 of 10 publications

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