In order to optimize the surface flatness and roughness of borosilicate glass, this study employs the chemical mechanical polishing technology(CMP) for the surface flattening of borosilicate glass. The polishing characteristics of the sample has been studied by adjusting the process parameters of CMP, including the polishing time, the rotate speed of polishing disk, the rate of polishing liquid flow, and the polishing pressure. And finally, the surface flattening treatment of the sample was realized in the study. The results show that when the process parameters varied, the surface peak-valley value and surface roughness value of the glass shared the similar trend. As the polishing time increased, they decreased rapidly and then gradually stabilized. During the increase of the rotate speed of polishing disk, the rate of polishing liquid flow, and the polishing pressure, they showed a trend of firstly decreasing and then increasing.
The aim of this work is the formation of anti-blue light coatings which are suitable for application on 3C products. Atomic layer deposition was used to deposit Al2O3 and TiO2 single layer films onto glass substrates at 250 °C. Optical characterization of the films was conducted to evaluate whether the thickness was suitable for the fabrication of multipair reflective coatings. The refractive indices of the films measured at an optical wavelength of 450 nm were 1.68 (67 nm, Al2O3) and 2.67 (42 nm, TiO2). Al2O3/TiO2 multilayer DBRs with 1.5, 3.5, 5.5 and 7.5 pairs were deposited on glass substrates. The thickness of each layer of Al2O3 and TiO2 films were 63.7 and 49.6 nm in the multilayer structure measured via FE-TEM. When 1.5-pair Al2O3/TiO2 DBRs were deposited on the glass substrate, the films had high transparency, and less reflective effect were observed. As 3.5, 5.5 and 7.5-pair DBRs were deposited on the glass substrates, the Bragg reflection effect became apparent. We found 7.5-pair Al2O3/TiO2 DBRs prepared by ALD had the best central and bandwidth of the Bragg reflection effect for blue light.
The anti-vignetting glass (AVG) is the key material for super-second and third-generation low-light image intensifiers. With the development of low-light night vision technology, the requirements of high precision and low damage are put forward to AVG. However, traditional measurement methods, such as vernier calipers, micrometers, dial indicators, etc., are all contact measurement, which will inevitably cause damage to AVG during the measurement process. They cannot meet the technical requirements for low damage. Non-contact measurement technology is a non-destructive testing method that realizes the geometric measurement of AVG by writing measurement programs and setting measurement parameters. However, due to the special structure of AVG, the non-contact measurement technology has measurement errors and cannot meet the high-precision measurement requirements. In this paper systematically analyzes the causes of errors in non-contact measurement technology by studying the characteristics of the light source, the difference in light intensity, and the way of grabbing contour edges. Through the error correction technology, the error of the non-contact measurement technology is eliminated, the AVG high-precision and low-damage non-destructive testing is realized.
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