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Jintao Han
at Xian Technological University
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Publications (1)
Proceedings Article | 18 September 2014 Paper
Research of thin film damage testing based on photothermal deflection
Jintao Han, Lihong Yang, Junhong Su, Tao Wang
Proceedings Volume 9282, 928222 (2014) https://doi.org/10.1117/12.2067891
KEYWORDS: Thin films, Laser induced damage, Silica, Reflectivity, Laser systems engineering, Refractive index, Systems modeling, Reflection, Instrument modeling, Image processing
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