Jochen P. Hoffmann
Senior Scientist at Wyle Aerospace
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 21 July 2004 Paper
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Reflection, Polymers, Microscopy, Interfaces, Nondestructive evaluation, Ultrasonics, Humidity, Signal processing, Aluminum, Acoustics

Proceedings Article | 21 July 2004 Paper
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Transformers, Sensors, Copper, Resistance, Corrosion, Magnetism, Magnetic sensors, Solid state electronics, Aircraft structures, Temperature metrology

Proceedings Article | 21 July 2004 Paper
Proc. SPIE. 5392, Testing, Reliability, and Application of Micro- and Nano-Material Systems II
KEYWORDS: Microscopy, X-rays, Coating, Corrosion, Image resolution, Interferometry, Nondestructive evaluation, Ultrasonics, Scanning electron microscopy, Acoustics

Proceedings Article | 22 July 2003 Paper
Proc. SPIE. 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems
KEYWORDS: Thermography, Imaging systems, Signal attenuation, Ultrasonography, Microscopy, Corrosion, Nondestructive evaluation, Ultrasonics, Transducers, Acoustics

Proceedings Article | 7 June 2002 Paper
Proc. SPIE. 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
KEYWORDS: Reflection, Polymers, Spectroscopy, Ultraviolet radiation, Microscopy, Coating, Nondestructive evaluation, Epoxies, Acoustics, Absorption

Showing 5 of 7 publications
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