John Steven Anderson
SPIE Involvement:
Author
Publications (13)

Proceedings Article | 17 May 2006 Paper
M. Ray, S. Baur, C. Le Pere, C. Hewitt, E. Gordon, A. Kennedy, R. Chin, D. Murphy, J. Wyles, S. Anderson, D. Van Lue, H. Gonzalez, T. Sessler, S. Ton, R. Wyles
Proceedings Volume 6206, 62061A (2006) https://doi.org/10.1117/12.674018
KEYWORDS: Staring arrays, Sensors, Microbolometers, Electronics, Readout integrated circuits, Cameras, Nonuniformity corrections, Thermography, Resistance, Infrared imaging

Proceedings Article | 30 August 2004 Paper
Adam Kennedy, S. Ton, David Van Lue, Steven Anderson, Richard Wyles, Thomas Kostrzewa, Stefan Baur, Richard Chin, C. Le Pere, James Asbrock, T. Sessler, C. Hewitt, Michael Ray, H. Gonzales, Daniel Murphy, Jessica Wyles, Eli Gordon
Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.548883
KEYWORDS: Microbolometers, Staring arrays, Sensors, Readout integrated circuits, Imaging systems, Electronics, Infrared imaging, Thermography, Resistance, Semiconducting wafers

Proceedings Article | 10 October 2003 Paper
Chungte Chen, C. Le Pere, John Anderson, Daniel Murphy, Richard Chin, K. Kostrzewa, S. Ton, James Miller, H. Gonzalez, Ronald Hegg, Michael Ray, Gwendolyn Newsome, Adam Kennedy, Richard Wyles, Daryl Bradley
Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.487646
KEYWORDS: Sensors, Staring arrays, Thermography, Infrared sensors, Cameras, Infrared imaging, Microbolometers, Readout integrated circuits, Surveillance, Unmanned aerial vehicles

Proceedings Article | 10 October 2003 Paper
Adam Kennedy, David Van Lue, John Anderson, C. Le Pere, James Asbrock, H. Gonzales, Richard Chin, C. Hewitt, Daryl Bradley, Richard Wyles, Daniel Murphy, T. Sessler, Jessica Wyles, Thomas Kostrzewa, Michael Ray
Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.487657
KEYWORDS: Microbolometers, Sensors, Staring arrays, Readout integrated circuits, Resistance, Thermography, Imaging systems, Electronics, Cameras, Unmanned aerial vehicles

Proceedings Article | 23 January 2003 Paper
Daryl Bradley, John Anderson, Richard Chin, Thomas Kostrzewa, Michael Ray, Daniel Murphy, David Van Lue, Adam Kennedy, Jessica Wyles, Nancy Lum, Richard Wyles, James Asbrock, C. Hewitt
Proceedings Volume 4820, (2003) https://doi.org/10.1117/12.453902
KEYWORDS: Staring arrays, Microbolometers, Sensors, Resistance, Thermography, Semiconducting wafers, Micromachining, Image quality, Image resolution, Analog electronics

Showing 5 of 13 publications
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